Pointprobe® silicon AFM probes

Most widely used and best-known AFM probe world-wide

Our Pointprobe® is a versatile silicon AFM probe for very high resolution AFM imaging and fits to all well-known commercial SPMs (Scanning Probe Microscopes) and AFMs (Atomic Force Microscopes). It consists of a single crystal silicon AFM cantilever with an integrated single crystal silicon AFM tip. The AFM cantilever and the AFM tip are supported by a single crystal silicon AFM support chip. True atomic resolution has been achieved by several research facilities in UHV using our Non-Contact / Tapping Mode AFM probes NCH and NCL.

The AFM probes of the Pointprobe® series are the most widely used and best known AFM probes worldwide. The product series comprises AFM probes for the widest range of applications. The Pointprobe® AFM probes are available with different coatings like Platinum-Iridium (PtIr5), Magnetic, Diamond or Gold.

Additionally we offer special AFM tip versions such as our SuperSharpSilicon™ for high resolution imaging or High Aspect Ratio AFM Tips for deep trench measurements.

For detailed information see below:

Complete AFM Probes Brochure is available for download here.

Application	Order Code	Tip Side Coating	Detector Side Coating	Res. Frequency	Force Constant	Features
Contact mode	CONT	None	None	13 kHz	0.2 N/m	Standard tip shape
	CONTR	None	Reflex (Al)	13 kHz	0.2 N/m	Standard tip shape
	CONTPt	PtIr5	PtIr5	13 kHz	0.2 N/m	Standard tip shape
Contact mode (short cantilever)	CONTSC	None	None	25 kHz	0.2 N/m	Short cantilever
Contact mode (short cantilever)	CONTSCR	None	Reflex (Al)	25 kHz	0.2 N/m	Short cantilever
Contact mode (Seiko or Zeiss)	ZEILR	None	Reflex (Al)	27 kHz	1.6 N/m	Standard tip shape
Non-contact / tapping mode (high frequency)	NCH	None	None	320 kHz	42 N/m	Standard tip shape
	NCHR	None	Reflex (Al)	320 kHz	42 N/m	Standard tip shape
	NCHPt	PtIr5	PtIr5	320 kHz	42 N/m	Standard tip shape
	SSS-NCH	None	None	320 kHz	42 N/m	SuperSharpSilicon™ tip
	AR5-NCHR	None	Reflex (Al)	320 kHz	42 N/m	High Aspect Ratio Tip (5:1)
	AR10-NCHR	None	Reflex (Al)	320 kHz	42 N/m	High Aspect Ratio Tip (10:1)
	AR5T-NCHR	None	Reflex (Al)	330 kHz	42 N/m	Tilt compensated High Aspect Ratio Tip (5:1)
	DT-NCHR	Diamond	Reflex (Al)	400 kHz	80 N/m	Diamond coated tip
	CDT-NCHR	Conductive diamond	Reflex (Al)	400 kHz	80 N/m	Conductive diamond coated tip
Non-contact / soft tapping mode	NCST	None	None	160 kHz	7.4 N/m	Standard tip shape
Non-contact / soft tapping mode	NCSTR	None	Reflex (Al)	160 kHz	7.4 N/m	Standard tip shape
Non-contact / tapping mode (long cantilever)	NCL	None	None	190 kHz	48 N/m	Standard tip shape
	NCLR	None	Reflex (Al)	190 kHz	48 N/m	Standard tip shape
	NCLPt	PtIr5	PtIr5	190 kHz	48 N/m	Standard tip shape
	SSS-NCL	None	None	190 kHz	48 N/m	SuperSharpSilicon™ tip
	AR5-NCLR	None	Reflex (Al)	190 kHz	48 N/m	High Aspect Ratio Tip (5:1)
	DT-NCLR	Diamond	Reflex (Al)	210 kHz	72 N/m	Diamond coated tip
	CDT-NCLR	Conductive diamond	Reflex (Al)	210 kHz	72 N/m	Conductive diamond coated tip
Non-contact / tapping mode (Seiko non-contact mode)	SEIHR	None	Reflex (Al)	130 kHz	15 N/m	Standard tip shape
Non-contact / tapping mode (Seiko non-contact mode)	SSS-SEIH	None	None	130 kHz	15 N/m	SuperSharpSilicon™ tip
Force modulation mode	FM	None	None	75 kHz	2.8 N/m	Standard tip shape
	FMR	None	Reflex (Al)	75 kHz	2.8 N/m	Standard tip shape
	DT-FMR	Diamond	Reflex (Al)	105 kHz	6.2 N/m	Diamond coated tip
	CDT-FMR	Conductive diamond	Reflex (Al)	105 kHz	6.2 N/m	Conductive diamond coated tip
Electrostatic force microscopy	EFM	PtIr5	PtIr5	75 kHz	2.8 N/m	Standard tip shape
Magnetic force microscopy	MFMR	Hard magnetic, medium momentum	Reflex (Al)	75 kHz	2.8 N/m	Standard tip shape
Magnetic force microscopy	S-MFMR	Soft magnetic, medium momentum	Reflex (Al)	75 kHz	2.8 N/m	Standard tip shape

SSS SuperSharpSilicon™ Tip
AR5 High Aspect Ratio Tip (5:1)
AR10 High Aspect Ratio Tip (10:1)
AR5T Tilt Compensated High Aspect Ratio Tip (5:1)

DT Diamond Coated Tip
CDT Conductive Diamond Coated Tip
PtIr5 Platinum Iridium5 Coating
Reflex (Al) Platinum Iridium5 Coating

All data are subject to change without notice.
All data are typical values, for guaranteed specifications see detailed description of probe type.

In addition, special silicon AFM probes can be designed and manufactured upon customer's request.
Please contact our development team at developers@nanoworld.com.

For detailed information about our AFM probe product series please see below: