SEIHR - NanoWorld®

Type: SEIHR

SEIKO INSTRUMENTS microscopes - Non-contact mode - High force constant - Reflex coating

Cantilever Data	Value	Range*
Resonance Frequency	130 kHz	110 - 150 kHz
Force Constant	15 N/m	9 - 25 N/m
Length	225 µm	220 - 230 µm
Mean Width	33 µm	27.5 - 37.5 µm
Thickness	5 µm	4.5 - 5.5 µm

*Typical values

How to optimize AFM scan parameters

How to use on Bruker® AFM systems

This AFM probe has alignment grooves on the back side of the support chip.

Pointprobe® AFM tip

Product Description

NanoWorld® Pointprobe® SEIHR probes are designed for owners of a Seiko Instruments microscope using the non-contact mode. All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.

Additionally, this AFM probe offers typical AFM tip radius of curvature of less than 8 nm.

A trapezoidal cross section of the AFM cantilever and therefore 30% wider (e.g. NCH) AFM cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.

Tip shape: Standard

Coating: Reflective Aluminum

Aluminum Reflex Coating

The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the AFM cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the AFM cantilever.

Order Codes

Order Code	Quantity	Data Sheet
SEIHR-10	10	yes
SEIHR-20	20	yes
SEIHR-50	50	no
SEIHR-W	380	yes

NanoWorld® Pointprobe® Silicon AFM Probes Screencast (Standard AFM Tip)

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Guaranteed values

Bruker® is a trademark of Bruker Corporation

Scientific publications mentioning use of this AFM probe

Gies, Mario, Fabian Michel, Christian Lupó, Derck Schlettwein, Martin Becker, and Angelika Polity
Electrochromic switching of tungsten oxide films grown by reactive ion-beam sputter deposition
Journal of Materials Science. 2021 Jan;56(1):615-28.
DOI: https://doi.org/10.1007/s10853-020-05321-y

Fabian Schmitz, Jonas Horn, Nicola Dengo, Alexander E. Sedykh, Jonathan Becker, Elena Maiworm, Péter Bélteky, Ákos Kukovecz, Silvia Gross, Francesco Lamberti, Klaus Müller-Buschbaum, Derck Schlettwein, Daniele Meggiolaro, Marcello Righetto, and Teresa Gatti
Large cation engineering in two-dimensional silver–bismuth bromide double perovskites
Chemistry of Materials. 2021 May 28;33(12):4688-700
DOI: 10.1021/acs.chemmater.1c01182

Nguyen, Thi Hai Quyen, Marius Pelmuş, Christopher Colomier, Sergiu M. Gorun, and Derck Schlettwein
The influence of intermolecular coupling on electron and ion transport in differently substituted phthalocyanine thin films as electrochromic materials: a chemistry application of the Goldilocks principle.
Physical Chemistry Chemical Physics. 2020;22(15):7699-709.
DOI: 10.1039/C9CP06709D

Kitano, Hiroki, Aiko Yamamoto, Masanao Niwa, So Fujinami, Ken Nakajima, Toshio Nishi, and Sachio Naito
Young's modulus mapping on hair cross-section by atomic force microscopy
Composite Interfaces. 2009 Jan 1;16(1):1-2.
DOI: https://doi.org/10.1163/156855408X379397

B S Li, A Wu and P M Vilarinho
Microscopic local fatigue in PZT thin films
Journal of Physics D: Applied Physics. 2007 Nov 16;40(23):7475.
DOI: 10.1088/0022-3727/40/23/033

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For more information contact: info@nanoworld.com

Pointprobe® is a registered trademark of NanoWorld AG

All data are subject to change without notice.

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