AR10-NCHR - NanoWorld®

Type: AR10-NCHR

High Aspect Ratio (> 10:1) - Non-contact/Tapping™ mode - High resonance frequency - Reflex coating

Cantilever Data	Value	Range*
Resonance Frequency	320 kHz	250 - 390 kHz
Force Constant	42 N/m	21 - 78 N/m
Length	125 µm	120 - 130 µm
Mean Width	30 µm	25 - 35 µm
Thickness	4 µm	3.5 - 4.5 µm

*Typical values

How to optimize AFM scan parameters

How to use on Bruker® AFM systems

This AFM probe has alignment grooves on the back side of the support chip.

High Aspect Ratio Tip (AR5)

Product Description

NanoWorld® Pointprobe® NCH probes are designed for non-contact or tapping mode imaging. This AFM probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.

For measurements on samples with sidewall angles approaching 90° we offer specially tailored AFM tips showing a high aspect ratio portion with near-vertical sidewalls.

These AFM probes offer unique features:

length of the high aspect ratio portion of the AFM tip > 1.5 µm
typical aspect ratio of this portion in the order of 12:1
(when viewed from side as well as along AFM cantilever axis!)
half cone angle of the high aspect ratio portion typically < 2.8°
excellent tip radius of curvature.

A trapezoidal cross section of the AFM cantilever and therefore 30% wider (e.g. NCH) AFM cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.

Tip shape: High-Aspect-Ratio

Coating: Reflective Aluminum

Aluminum Reflex Coating

The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the AFM cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the AFM cantilever.