Pyrex-Nitride AFM Probes
Leading edge in AFM tip sharpness and durability
Type | Cantilever(s) Shape | Tip Side Coating | Detector Side Coating | Res. Frequency | Force Constant |
---|---|---|---|---|---|
PNP-DB
(2 cantilevers) |
Beam | None | Reflex (Au) |
CB1: 67 kHz CB2: 17 kHz |
CB1: 0.48 N/m CB2: 0.06 N/m |
PNP-TR
(2 cantilevers) |
Triangle | None | Reflex (Au) |
CB1: 67 kHz CB2: 17 kHz |
CB1: 0.32 N/m CB2: 0.08 N/m |
PNP-TR-Au
(2 cantilevers) |
Triangle | Au | Reflex (Au) |
CB1: 67 kHz CB2: 17 kHz |
CB1: 0.32 N/m CB2: 0.08 N/m |
PNP-TRS | Triangle | None | Reflex (Au) | 67 kHz | 0.32 N/m |
PNP-TR-TL
(2 cantilevers) |
Triangle | None | Reflex (Au) |
CB1: 67 kHz CB2: 17 kHz |
CB1: 0.32 N/m CB2: 0.08 N/m |
PNP-TR-TL-Au
(2 cantilevers) |
Triangle | Au | Reflex (Au) |
CB1: 67 kHz CB2: 17 kHz |
CB1: 0.32 N/m CB2: 0.08 N/m |
All data are subject to change without notice.
All data are typical values, for guaranteed specifications see detailed description of probe type.
In addition, special silicon AFM probes can be designed and manufactured upon customer's request.
Please contact our development team at developers@nanoworld.com.
PeakForce Tapping™ and ScanAsyst® are registered trademarks of Bruker Corporation
For detailed information about our AFM probe product series please see below: