Type: NCH
Non-contact / Tapping™ mode - High resonance frequency
Cantilever Data | Value | Range* |
---|---|---|
Resonance Frequency | 320 kHz | 250 - 390 kHz |
Force Constant | 42 N/m | 21 - 78 N/m |
Length | 125 µm | 120 - 130 µm |
Mean Width | 30 µm | 25 - 35 µm |
Thickness | 4 µm | 3.5 - 4.5 µm |
*Typical values
This AFM probe has alignment grooves on the back side of the support chip.
Pointprobe® AFM tip
NanoWorld® Pointprobe® NCH probes are designed for non-contact or tapping mode imaging. This AFM probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.
Additionally, this AFM probe offers typical tip radius of curvature of less than 8 nm.
For applications requiring lower resonance frequencies or a AFM cantilever length exceeding 125 µm we recommend our Pointprobe® type NCL.
A trapezoidal cross section of the AFM cantilever and therefore 30% wider (e.g. NCH) AFM cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.
Tip shape: Standard
Coating: none
NanoWorld® Pointprobe® Silicon AFM Probes Screencast (Standard AFM Tip)
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For more information contact: info@nanoworld.com
Pointprobe® is a registered trademark of NanoWorld AG
All data are subject to change without notice.
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CH-2000 Neuchâtel,
Switzerland
www.nanoworld.com
For detailed information about our AFM probe product series please see below: