AFM Probes Series

• most widely used and best known SPM and AFM probe world-wide

• silicon SPM and AFM probe for very high resolution imaging

• alignment grooves on back side of AFM probe support chip

• typical AFM tip radius < 8 nm

• guaranteed AFM tip radius <12 nm

• available with different AFM tip shapes

• ultra-short cantilevers designed for High-Speed Scanning AFM (HSS-AFM)

• 3 types of AFM cantilevers with very high resonance frequencies (1.2 MHz - 5 MHz) and high force constants for dynamic mode AFM applications in air

• 3 types of AFM cantilevers with high resonance frequencies and low force constants (0.6 N/m – 0.15 N/m) mainly for AFM applications in liquid

• wear resistant High Density Carbon/Diamond Like Carbon (HDC/DLC) AFM tip

• typical AFM tip radius < 10 nm

• optimized positioning through maximized AFM tip visibility

• three sided AFM tip defined by real crystal planes

• special AFM tip shape leads to very symmetric scans

• AFM tip at the very end of the AFM cantilever

• typical AFM tip radius < 10 nm, guaranteed <15 nm

• also available as a High-Speed Scanning AFM (HSS-AFM) version with a resonance frequency of up to 2 MHz

• silicon nitride AFM cantilevers and AFM tips

• designed for various AFM imaging applications in contact mode or dynamic mode AFM

• oxide sharpened pyramidal AFM tips

• typical AFM tip radius < 10 nm

• available either with triangular or rectangular AFM cantilevers

• also available as tipless version