Type: SSS-SEIH
SuperSharpSilicon™ - SEIKO INSTRUMENTS microscopes - Non-contact mode - High force constant
Cantilever Data | Value | Range* |
---|---|---|
Resonance Frequency | 130 kHz | 110 - 150 kHz |
Force Constant | 15 N/m | 9 - 25 N/m |
Length | 225 µm | 220 - 230 µm |
Mean Width | 33 µm | 27.5 - 37.5 µm |
Thickness | 5 µm | 4.5 - 5.5 µm |
*Typical values
This AFM probe has alignment grooves on the back side of the support chip.
SuperSharpSilicon™ Tip (SSS)
NanoWorld® Pointprobe® SEIHR probes are designed for owners of a Seiko Instruments microscope using the non-contact mode. All AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.
For enhanced resolution of nanostructures and microroughness we have developed an advanced AFM tip manufacturing process leading to unrivalled sharpness of the SuperSharpSilicon™ tip.
This AFM probe offers unique features:
- Typical AFM tip radius of curvature of 2 nm
- Guaranteed AFM tip radius of curvature 5 nm (yield >80%)
- Half cone angle < 10° at the last 200 nm of the AFM tip
A trapezoidal cross section of the AFM cantilever and therefore 30% wider (e.g. NCH) AFM cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.
Tip shape: Supersharp
Coating: none
NanoWorld® Pointprobe® SuperSharpSilicon™ AFM Tip (SSS) Screencast
Subscribe to NanoWorld® Youtube Channel
For more information contact: info@nanoworld.com
Pointprobe® is a registered trademark of NanoWorld AG
All data are subject to change without notice.
NanoWorld AG
Rue des Saars 10
CH-2000 Neuchâtel,
Switzerland
www.nanoworld.com
For detailed information about our AFM probe product series please see below: