NanoWorld® Pointprobe® FM probes are designed for force modulation mode imaging. The force constant of the FM type fills the gap between contact and non-contact probes. Furthermore non-contact or tapping mode imaging is possible with this AFM probe. All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.

For applications that require hard contact between AFM tip and sample this AFM probe offers a real diamond tip-side coating. This coating features extremely high wear resistance due to the unsurpassed hardness of diamond.

The typical macroscopic AFM tip radius of curvature lies in the range between 100 and 200 nm. Nanoroughnesses in the 10 nm region improve the resolution on flat surfaces.

The CDT features a conductive diamond coating. Some typical applications for this AFM tip are Tunneling AFM (Conducting AFM) and Scanning Capacitance Microscopy (SCM).

A trapezoidal cross section of the AFM cantilever and therefore 30% wider (e.g. NCH) AFM cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.

Conductive Diamond Coating / Aluminum Reflex Coating

The conductive diamond coating consists of a 100 nm thick polycrystalline diamond layer deposited on the tip side of the AFM cantilever resulting in an unsurpassed hardness of the AFM tip. The coating is highly doped with boron which leads to a macroscopic resistivity of 0.003 - 0.005 Ohm•cm.

The aluminum reflex coating deposited on the detector side of the AFM cantilever enhances the reflectance of the laser beam and prevents light from interfering within the AFM cantilever.