Pyrex Nitride Series AFM Tips - General Description

General

• SPM and AFM probes for a wide range of applications in contact mode or dynamic mode
• fit to all well-known commercial SPMs and AFMs
• silicon nitride AFM cantilevers and AFM tips
• AFM cantilevers are supported by a support chip made of pyrex-glass
• delivered as separated single support chips for easy handling

Material Features

• low-stress silicon nitride for lowest AFM cantilever bending
• excellent hardness for wear resistance and extended lifetime

AFM Cantilevers

• multi-lever design with either rectangular AFM cantilevers or triangular AFM cantilevers
• single lever version with one triangular AFM cantilever (for PeakForce Tapping™* and ScanAsyst®* modes)
• reflective gold coating on the detector side of the AFM cantilevers
• stress compensated with bending below 2°

Support Chip

• support chips made of pyrex-glass (3.4 mm x 1.6 mm x 0.5 mm)
• easy handling due to single support chips

AFM Tips

• oxide sharpened pyramidal AFM tips
• AFM tip height 3.5 µm and AFM tip radius of curvature typically < 10 nm
• macroscopic half cone angles 35°