Arrow™ FMR - NanoWorld®

Type: Arrow™ FMR

Force Modulation Mode - Reflex Coating

Cantilever Data	Value	Range*
Resonance Frequency	75 kHz	58 - 97 kHz
Force Constant	2.8 N/m	1.4 - 5.8 N/m
Length	240 µm	235 - 245 µm
Mean Width	35 µm	30 - 40 µm
Thickness	3 µm	2.5 - 3.5 µm

*Typical values

How to optimize AFM scan parameters

How to use on Bruker® AFM systems

ARROW™ AFM tip More images

Product Description

Optimized positioning through maximized AFM tip visibility

NanoWorld® Arrow™ FM probes are designed for Force Modulation Mode imaging. The Force Constant of the FM type fills the gap between Contact and Non-Contact AFM probes. Furthermore Non-Contact / TappingMode™ imaging is possible with this AFM probe.

All SPM and AFM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. These AFM probes feature a rectangular AFM cantilever with a triangular free end and a tetrahedral AFM tip with a typical height of 10 - 15 µm.

Additionally, this AFM probe offers an AFM tip radius of curvature of less than 10 nm.

The unique Arrow™ shape with the AFM tip position at the very end of the AFM cantilever allows easy positioning of the AFM tip on the area of interest.

A trapezoidal cross section of the AFM cantilever and therefore 30% wider (e.g. NCH) AFM cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.

Tip shape: Arrow

Coating: Reflective Aluminum

Aluminum Reflex Coating

The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the AFM cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the AFM cantilever.

Order Codes

Order Code	Quantity	Data Sheet
ARROW-FMR-10	10	Nominal values
ARROW-FMR-20	20	Nominal values
ARROW-FMR-50	50	Nominal values
ARROW-FMR-W	380	Nominal values

NanoWorld® Arrow™ Silicon AFM Probes Screencast

Subscribe to NanoWorld® Youtube Channel

Guaranteed values

Bruker® is a trademark of Bruker Corporation

Scientific publications mentioning use of this AFM probe

Hsieh, Shu-Ling, Jyh-Jye Wang, Kuan-Hua Su, Ying-Lan Kuo, Shuchen Hsieh, and Chih-Chung Wu
Suppressive Effects of the Gynura bicolor Ether Extract on Endothelial Permeability and Leukocyte Transmigration in Human Endothelial Cells Induced by TNF‐α.
Evidence‐Based Complementary and Alternative Medicine. 2020;2020(1):9413724.
DOI: https://doi.org/10.1155/2020/9413724

De Lise, Federica, Francesca Mensitieri, Giulia Rusciano, Fabrizio Dal Piaz, Giovanni Forte, Flaviana Di Lorenzo, Antonio Molinaro Zarrelli A, Romanucci V, Cafaro V, Sasso A.
Novosphingobium sp. PP1Y as a novel source of outer membrane vesicle
Journal of Microbiology. 2019 Jun;57:498-508
DOI: https://doi.org/10.1007/s12275-019-8483-2

Kung, Mei-Lang, Chiung-Wen Hsieh, Ming-Hong Tai, Chien-Hui Weng, Deng-Chyang Wu, Wen-Jeng Wu, Bi-Wen Yeh
Nanoscale characterization illustrates the cisplatin-mediated biomechanical changes of B16-F10 melanoma cells
Physical Chemistry Chemical Physics. 2016;18(10):7124-31
DOI: https://doi.org/10.1039/C5CP07971C

Arnould, Olivier, and Richard Arinero
Towards a better understanding of wood cell wall characterisation with contact resonance atomic force microscopy
Composites Part A: Applied Science and Manufacturing. 2015 Jul 1;74:69-76
DOI: https://doi.org/10.1016/j.compositesa.2015.03.026

Chen, Yuhang, Tingting Luo, and Wenhao Huang
Focused ion beam fabrication and atomic force microscopy characterization of micro/nanoroughness artifacts with specified statistic quantities
IEEE Transactions on Nanotechnology. 2014 Mar 11;13(3):563-73
DOI: https://doi.org/10.1109/TNANO.2014.2311103

Hsieh, Shuchen, Shu-Ling Hsieh, Chiung-wen Hsieh, Po-Chiao Lin, and Chun-Hsin Wu
Label‐Free Glucose Detection Using Cantilever Sensor Technology Based on Gravimetric Detection Principles
Journal of Analytical Methods in Chemistry. 2013;2013(1):687265
DOI: https://doi.org/10.1155/2013/687265

Print

For more information contact: info@nanoworld.com

Pointprobe® is a registered trademark of NanoWorld AG

All data are subject to change without notice.

NanoWorld AG
Rue des Saars 10
CH-2000 Neuchâtel,
Switzerland
www.nanoworld.com