Ultra-Short Cantilevers Series - General Description - AFM Tips - NanoWorld

General

• especially designed for high speed scanning applications
• cannot be used in all commercial SPMs and AFMs due to the small dimensions of the AFM cantilevers
• AFM cantilever and AFM tip are supported by a single crystal silicon support chip
• no intrinsic stress and absolutely straight AFM cantilevers

AFM Cantilever

• rectangular AFM cantilever with rounded corners at the freestanding end
• AFM cantilever made of quartz-like material

Support Chip

• dimensions of the silicon support chip are very reproducible (3.4 mm x 1.6 mm x 0.3 mm)
• etched and lowered corners of the support chip avoid contact between the support chip and the sample
• alignment grooves on the back side of the silicon support chip in conjunction with the alignment chip ensure replacement of the AFM probes without major readjustment of the laser beam

AFM Tip

• nanotools® High Density Carbon/Diamond Like Carbon (HDC/DLC) tip
• AFM tip height typically 2.5 μm and radius of curvature typically < 10 nm  
• AFM tip aspect ratio typically 5:1 and tilt compensation of 8°