How to perform an AFM measurement in contact mode on Bruker® AFM systems with Nanoscope® software, using CONT AFM tips - NanoWorld®

This is a how-to-use step-by-step instruction on how to set up and scan in contact mode using the respective NanoWorld® AFM probe.

This instruction is valid for the following NanoWorld® contact mode AFM probes:

Steps
Step 1 - mount AFM probe and select AFM Experiment
- Mount AFM probe into AFM probe holder
- In Choose an Experiment Category: select Contact Mode
- In Select Experiment Group: select Contact Mode in Air
Step 2 - select AFM probe
- In Contact in Air select Setup
- In Probe I'll be using select New Probe of type
- From dropdown menu select ESP
Step 3 - adjust laser
- In Contact in Air select Setup
- Adjust laser on AFM cantilever
- Adjust laser on detector
- Maximize SUM signal
Step 4 - focus on sample / AFM tip reflection
- In Contact in Air select Navigate
- In Focus Sample: select Sample (default) or Tip Reflection
- Focus on sample, respectively on AFM tip reflection, by moving the scan head up or down
Step 5 - set scan size and engage AFM probe
- In Contact in Air select Check Parameters
- Adjust Scan Size
- Select Engage
Step 6 - scan sample, check and adjust scan parameters
- Scan the sample Check and adjust Scan Size if needed
- Check and adjust Scan Rate (i.e. scan speed) if needed
- Check and adjust Integral Gain and Proportional Gain if needed