Contact Mode AFM Probes

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  CONT

  [C = 0.2 N/m; fo = 13 kHz]

  Pointprobe® Silicon AFM Probe

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  CONTR R

  [C = 0.2 N/m; fo = 13 kHz]

  Pointprobe® Silicon AFM Probe
  back side: reflex coating

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  Arrow™ CONT

  [C = 0.2 N/m; fo = 14 kHz]

  Arrow™ Silicon AFM Probe

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  Arrow™ CONTR R

  [C = 0.2 N/m; fo = 14 kHz]

  Arrow™ Silicon AFM Probe
  back side: reflex coating

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  ZEILR R

  [C = 1.6 N/m; fo = 27 kHz]

  (for Zeiss Veritekt AFMs)
  Pointprobe® Silicon AFM Probe
  back side: reflex coating

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  CONTSC

  [C = 0.2 N/m; fo = 25 kHz]

  Pointprobe® Silicon AFM Probe

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  CONTSCR R

  [C = 0.2 N/m; fo = 25 kHz]

  Pointprobe® Silicon AFM Probe
  back side: reflex coating

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  PNP-DB G

  [C₁ = 0.48 N/m; fo₁ = 67 kHz]

  [C₂ = 0.06 N/m; fo₂ = 17 kHz]

  Pyrex-Nitride AFM Probe for various imaging applications in contact or dynamic mode measurement and biological samples, two long and two short rectangular AFM cantilevers
  back side: gold coating

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  PNP-TR G

  [C₁ = 0.32 N/m; fo₁ = 67 kHz]

  [C₂ = 0.08 N/m; fo₂ = 17 kHz]

  Pyrex-Nitride AFM Probe for various imaging applications in contact or dynamic mode measurement and biological samples, two long and two short triangular AFM cantilevers
  back side: gold coating

Back side coating for higher laser reflectance: RReflex (aluminum) GGold PPtlr5