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Magnetic Force Microscopy is a type of Atomic Force Microscopy in which a magnetised AFM tip is used to measure magnetic interactions between the tip and the surface of a magnetic sample. These detected interactions are then used to reconstruct the magnetic structure of the sample surface
NanoWorld currently offers two types of MFM tips:
– MFMR – This type of magnetic AFM tip is coated with a hard magnetic coating on the tip side and yields a very high force sensitivity, while simultaneously enabling tapping and lift mode operation.
– S-MFMR – These magnetic AFM tips are coated with a soft magnetic layer on the tip side and are designed for the measurement of magnetic domains in soft magnetic samples.
Defects can significantly affect
performance of nanopatterned magnetic devices, therefore their influence on the
material properties has to be understood well before the material is used in
technological applications. However, this is experimentally challenging due to
the inability of the control of defect characteristics in a reproducible
manner.*
In “Magnetic reversal in perpendicularly magnetized antidot arrays with
intrinsic and extrinsic defects» Michal Krupinski, Pawel Sobieszczyk, Piotr Zieliński and Marta
Marszałek construct a micromagnetic model, which
accounts for intrinsic and extrinsic defects associated with the
polycrystalline nature of the material and with corrugated edges of
nanostructures.*
The findings described in their article show that magnetic properties and domain configuration in
nanopatterned systems are strongly determined by the defects, the heterogeneity
of the nanostructure sizes and edge corrugations, and that such imperfections
play a key role in the processes of magnetic reversal.*
The magnetic imaging described in the article cited above was performed using NanoWorld MFMR AFM probes for magnetic force microscopy (MFMR).
Figure 8 from “Magnetic reversal in perpendicularly magnetized antidot arrays with intrinsic and extrinsic defects” by Michal Krupinski et al.: (a) MFM image for an array with an antidot diameter 182 nm taken in zero field after ac demagnetization. Selected domain walls were marked with a blue line. (b) Simulated MFM image for an antidot diameter of 185 nm corresponding to the magnetic moment configuration depicted in Fig. 6b. The MFM tip distance from the sample surface was 180 nm.
*Michal
Krupinski, Pawel Sobieszczyk, Piotr Zieliński and Marta Marszałek Magnetic reversal in perpendicularly magnetized antidot arrays with
intrinsic and extrinsic defects
Nature Scientific Reports volume 9, Article number: 13276 (2019)
DOI: https://doi.org/10.1038/s41598-019-49869-5
Open Access:
The article “Magnetic reversal in perpendicularly magnetized antidot arrays
with intrinsic and extrinsic defects” by Michal Krupinski, Pawel Sobieszczyk,
Piotr Zieliński and Marta Marszałek is licensed under a Creative Commons
Attribution 4.0 International License, which permits use, sharing, adaptation,
distribution and reproduction in any medium or format, as long as you give
appropriate credit to the original author(s) and the source, provide a link to
the Creative Commons license, and indicate if changes were made. The images or
other third party material in this article are included in the article’s
Creative Commons license, unless indicated otherwise in a credit line to the
material. If material is not included in the article’s Creative Commons license
and your intended use is not permitted by statutory regulation or exceeds the
permitted use, you will need to obtain permission directly from the copyright
holder. To view a copy of this license, visit
http://creativecommons.org/licenses/by/4.0/.
