Check out our screencast about NanoWorld Ultra-Short Cantilevers AFM Probes Series.
It will give you an overview of our Ultra-Short Cantilevers (USC) which are dedicated to High-Speed AFM (HS-AFM).
Tag: high speed scanning
NanoWorld AG introduces Ultra-Short Cantilevers for High-Speed Atomic Force Microscopy (HS-AFM)
Neuchâtel, February 19th 2014, NanoWorld AG today announced the official commercialization of six types of Ultra-Short Cantilevers (USC) dedicated for use in High-Speed Atomic Force Microscopy (HS-AFM).
High Speed Atomic Force Microscopy is a quickly evolving technique within the field of Scanning Probe Microscopy that enables the users of dedicated instruments and AFM probes to visualize dynamic processes at the single molecule level. (See also www.highspeedscanning.com).
After a very successful beta-testing phase six types of AFM probes for high speed scanning will be commercially available from now on.
NanoWorld AG announces High Speed Scanning AFM website
Neuchâtel, June 1 st 2011, NanoWorld AG announced that it has launched a website entirely dedicated to High Speed Scanning Atomic Force Microscopy (HS-AFM) at www.highspeedscanning.com.
NanoWorld dedicates this website to the community of high speed scanning AFM users and focuses on the probe aspect of high speed scanning SPM.
For a long time Fast Scanning in Scanning Probe Microscopy was limited by two factors: no commercial High Speed Scanning Probe Microscopes (SPM) and Atomic Force Microscopes (AFM) were available and there were hardly any dedicated High Speed scanning probes on the market.
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