Tag: conductive AFM tip

Ferroelectric Domain Studies of Patterned (001) BiFeO3 by Angle-Resolved Piezoresponse Force Microscopy

Figure 1 from "Ferroelectric Domain Studies of Patterned (001) BiFeO 3 by Angle- Resolved Piezoresponse Force Microscopy": Patterned mesas are separated from the continuous film by lithography, as shown in the AFM topography image. (b) Schematic drawing of the atomic structure of BFO with angle-resolved polarization models. The Fe (red sphere) atom can be displaced towards twelve possible polarization orientations with respect to its centrosymmetric position. (c) AR-PFM domain map of a 1.2 × 1.2 μm2 area of unpatterned BFO film, corresponding to the black dashed area in (a). (d) The area distribution of each polarization variant according to angle relative to the [100] direction. (e) The average area of stable and meta-stable polarization variants.
Figure 1 from Seungbum Hong et al. “Ferroelectric Domain Studies of
Patterned (001) BiFeO3 by Angle-Resolved Piezoresponse Force Microscopy”:
Patterned mesas are separated from the continuous film by lithography, as shown in the AFM topography image.
(b) Schematic drawing of the atomic structure of BFO with angle-resolved polarization models. The Fe (red sphere) atom can be displaced towards twelve possible polarization orientations with respect to its centrosymmetric position. (c) AR-PFM domain map of a 1.2 × 1.2 μm2 area of unpatterned BFO film, corresponding to the black dashed area in (a). (d) The area distribution of each polarization variant according to angle relative to the [100] direction. (e) The average area of stable and meta-stable polarization variants.
NanoWorld EFM PtIr coated probes were used for the PFM measurements mentioned in this brand new publication on ferroelectric domain imaging of patterned BFO thin films in Scientific Reports.
Congratulations to the authors!
 #afmprobes #atomicforcemicroscopy #afmtips #AFM

Bumsoo Kim, Frank P. Barrows, Yogesh Sharma, Ram S. Katiyar, Charudatta Phatak, Amanda K. Petford-Long, Seokwoo Jeon, Seungbum Hong
Scientific Reports (2018) 8:20, DOI:10.1038/s41598-017-18482-9
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NANOWORLD POINTPROBE® DIAMOND COATED TIP (DT), CONDUCTIVE DIAMOND COATED TIP (CDT) SCREENCAST

Check out our screencast about NanoWorld Pointprobe® Diamond Coated Tip (DT), Conductive Diamond Coated Tip (CDT).

It will give you an overview of our Diamond Coated Tip (DT) and Conductive Diamond Coated Tip (CDT) which have been developed for applications that require hard contact between probe and sample. Some typical applications are friction force measurements, measurement of the elastic properties of samples, as well as wear measurements or nanostructuring.