conductive AFM tip

Kinetic-controlled Crystallization of α-FAPbI3 Inducing Preferred Crystallographic Orientation Enhances Photovoltaic Performance

Physical properties of the polycrystalline materials are mostly determined by their microstructure. As the crystallization process can determine the microstructure, the nucleation, and growth can also control whether the materials will be resulted in single crystalline or polycrystalline. Along with the morphological changes, anisotropic properties of the materials can also be controlled. *

As a result, preferential orientation with advanced optoelectronic properties can enhance the photovoltaic devices’ performance. *

Although incorporation of additives is one of the most studied methods to stabilize the photoactive α-phase of formamidinium lead tri-iodide (α-FAPbI3), no studies focus on how the additives affect the crystallization kinetics. *

In the article “Kinetic-Controlled Crystallization of α-FAPbI3 Inducing Preferred Crystallographic Orientation Enhances Photovoltaic Performance” along with the role of methylammonium chloride (MACl) as a “stabilizer” in the formation of α-FAPbI3, Sooeun Shin, Seongrok Seo, Seonghwa Jeong, Anir S. Sharbirin, Jeongyong Kim, Hyungju Ahn, Nam-Gyu Park and Hyunjung Shin point out the additional role as a “controller” in the crystallization kinetics. *

With microscopic observations, for example, electron backscatter diffraction and selected area electron diffraction, it is examined that higher concentration of MACl induces slower crystallization kinetics, resulting in larger grain size and [100] preferred orientation. *

Optoelectronic properties of [100] preferentially oriented grains with less non-radiative recombination, a longer lifetime of charge carriers, and lower photocurrent deviations in between each grain induce higher short-circuit current density (Jsc) and fill factor. *

Resulting MACl40 mol% attains the highest power conversion efficiency (PCE) of 24.1%.

The results provide observations of a direct correlation between the crystallographic orientation and device performance as it highlights the importance of crystallization kinetics resulting in desirable microstructures for device engineering. *

The electrical characterizations with atomic force microscopy (AFM) and conductive atomic force microscopy ( C-AFM) were done to measure the local conductance of FAPbI3 films. All measurements were performed under illumination (green LED) with a 1.3 V bias using a Pt-coated C-AFM probe (NanoWorld PlatinumIridium coated Pointprobe® CONTPt ). FTO was used for the conductive substrates. *

Conductive atomic force microscopy (C-AFM) indicated much more homogeneous photocurrent generation along the surface of (100) preferentially oriented layers. *

Figure 4 from Sooeun Shin et al. 2023 “Kinetic-Controlled Crystallization of α-FAPbI3 Inducing Preferred Crystallographic Orientation Enhances Photovoltaic Performance”:
Electrical properties of (100)-oriented α-FAPbI3 thin films. a,b) Surface topography and photocurrent measurement by C-AFM of MACl10% and MACl40%. Measurements were taken under illumination (green LED) with a 1.3 V bias. Current images indicate that photocurrents were induced grain by grain, as each grain showed a distinct photocurrent. The photocurrent deviation for each grain is larger in MACl10% than in MACl40%, which shows a similar photocurrent grain by grain. c,d) Current line profile extracted from the current image (a and b). The standard deviation calculated from the magnitude of the photocurrent in each grain is displayed in the inset (0.019 and 0.014 nA for MACl10% and MACl40%, respectively). A low photocurrent was exhibited at the grain boundaries in both MACl10% and MACl40%. The dark areas measured within the current images are most likely distributed between grain edges. This may be caused by the formation of PbI2 or the loss of contact between the grain and the conducting substrate.

*Sooeun Shin, Seongrok Seo, Seonghwa Jeong, Anir S. Sharbirin, Jeongyong Kim, Hyungju Ahn, Nam-Gyu Park and Hyunjung Shin
Kinetic-Controlled Crystallization of α-FAPbI3 Inducing Preferred Crystallographic Orientation Enhances Photovoltaic Performance
Advanced Science, Volume 10, Issue 14, May 17, 2023, 2300798
DOI: https://doi.org/10.1002/advs.202300798

Open Access The article “Kinetic-Controlled Crystallization of α-FAPbI3 Inducing Preferred Crystallographic Orientation Enhances Photovoltaic Performance” Sooeun Shin, Seongrok Seo, Seonghwa Jeong, Anir S. Sharbirin, Jeongyong Kim, Hyungju Ahn, Nam-Gyu Park and Hyunjung Shin is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

Electrically and mechanically driven rotation of polar spirals in a relaxor ferroelectric polymer

Flux-closure structures, vortices/antivortices, skyrmions, and merons in oxides, metals and polymers represent non-trivial topologies in which a local polar/magnetic order undergoes quasi-continuous spatial variations in a host crystal lattice. These structures are now extensively studied due to emergent functionalities, but the application of electrical/mechanical fields has so far only served to destroy the polar topologies of interest. *

Topology created by quasi-continuous spatial variations of a local polarization direction represents an exotic state of matter, but field-driven manipulation has been hitherto limited to creation and destruction. *In the article “Electrically and mechanically driven rotation of polar spirals in a relaxor ferroelectric polymer” Mengfan Guo, Erxiang Xu, Houbing Huang, Changqing Guo, Hetian Chen, Shulin Chen, Shan He, Le Zhou, Jing Ma, Zhonghui Shen, Ben Xu, Di Yi, Peng Gao, Ce-Wen Nan, Neil. D. Mathur and Yang Shen report that relatively small electric or mechanical fields can drive the non-volatile rotation of polar spirals in discretized microregions of the relaxor ferroelectric polymer poly(vinylidene fluoride-ran-trifluoroethylene).*

These polar spirals arise from the asymmetric Coulomb interaction between vertically aligned helical polymer chains, and can be rotated in-plane through various angles with robust retention. *

Given also that their manipulation of topological order can be detected via infrared absorption, Mengfan Guo et al.’s work suggests a new direction for the application of complex materials. *

Mengfan Guo et al. produced a 100-nm-thick monolayer of face-on lamellae with vertically aligned polymer chains by melt-recrystallizing spin-coated thin films of P(VDF-TrFE).

The resulting melt-recrystallized thin film of the relaxor ferroelectric polymer was characterized by the authors using a commercial atomic force microscope for in-plane piezo-response force microscopy (IP-PFM).

NanoWorld Platinum Iridium coated Arrow-CONTPt AFM probes (typical resonant frequency: 14 kHz, typical force constant: 0.2 N/m, typical AFM tip radius 25 nm) were used for the in-plane (IP) PFM tests and the PFM lithography tests.

For piezo-response force microscopy (PFM) imaging, Vector mode was used where AFM tips were modulated at around 240 kHz for IP imaging, with the AC voltage set at 2 V. The images obtained by Vector Mode were double checked by using dual AC resonance tracking (DART) mode and the patterns could be reproduced. *

For angle-resolved IP-PFM tests, the rotation of sample was controlled by a protractor. To ensure identical position was imaged after rotating the sample, the authors made cross-scratches as a mark on the sample surface in advance. This method was applied to locate the scanning position in other situations if Mengfan Guo et al. had to move the sample in between the scanning probe microscopic studies.

For electric-field-induced manipulations using PFM lithography, the DC voltage on AFM tip was previously edited in the software. The scan speed was set at 1.95 Hz and no AC voltage was applied during the scanning. The DC voltage was divided by film thickness (100 nm) to obtain the electric field value. And an electric field with downward direction is defined with a positive sign.

For stress-induced manipulations, the deflection value of the PFM cantilever, which is a signal from photodetector, was preset to control the stress/force applied onto the sample. The difference in deflection value between a pressed AFM cantilever and a free AFM cantilever reflects how hard the AFM tip and sample surface are pressed to each other.*

To obtain the force value F, Mengfan Guo et al. first calibrated the AFM tips by the thermal noise method, and obtain the inverse optical lever sensitivity (InvOLS) and the spring constant k of the AFM tips.

The authors also conducted a polarization analysis based on their PFM measurements. *

To obtain the nominal toroidal order evaluated by the local curvature, the obtained IP-PFM amplitude image was firstly divided into 33 × 33 arrays, and each region was then subjected to a recognition of potential domain walls and measurement of an averaged curvature radius. *

To obtain polarization maps, angle-resolved IP-PFM images were first aligned to correct spatial distortion in nanoscale measurement. Positions with specific morphological characteristics were selected as reference points to determine the coordinate. After the correction, improved angle-resolved IP-PFM phase images would be divided into 64 × 64 arrays for deriving polarization maps. *

Fig. 1 from Mengfan Guo et al. (2024) “Electrically and mechanically driven rotation of polar spirals in a relaxor ferroelectric polymer”:Observation of a microregion containing an in-plane polar spiral. a Morphology of a melt-recrystallized thin film of the relaxor ferroelectric polymer. The scale bar is 2 μm. IP-PFM phase (b) and amplitude (c) images of the same area in a exhibiting concentric ring-shaped domains in curly stripe domains. d Distribution of domain wall curvatures in the same area in a–c evidencing nominal toroidal order. It is assumed that the local polarization is parallel to the nearest domain wall so that larger curvature (denoted red) reflects stronger toroidal order. IP-PFM phase images of identical concentric ring-shaped domains with the axis along vertical (e) and horizontal (f) measurement directions. The scale bar is 0.3 μm. The curl (g) and the divergence (h) of local polarization in the same area as e and f, revealing the polar spiral topology. i Schematic stereoscopic view of a CCW polar spiral, arrows represent regions of polarization. The red/blue arrows denote the polar source/sink that spirals in/out. The white arrows represent Néel rotation along the radial direction, as shown in more detail via the inset. NanoWorld Platinum Iridium coated Arrow-CONTPt AFM probes (typical resonant frequency: 14 kHz, typical force constant: 0.2 N/m, typical AFM tip radius 25 nm) were used for the in-plane (IP) PFM tests and the PFM lithography tests. — Fig. 1 from Mengfan Guo et al. (2024) “Electrically and mechanically driven rotation of polar spirals in a relaxor ferroelectric polymer”:
Observation of a microregion containing an in-plane polar spiral.
a Morphology of a melt-recrystallized thin film of the relaxor ferroelectric polymer. The scale bar is 2 μm. IP-PFM phase (b) and amplitude (c) images of the same area in a exhibiting concentric ring-shaped domains in curly stripe domains. d Distribution of domain wall curvatures in the same area in a–c evidencing nominal toroidal order. It is assumed that the local polarization is parallel to the nearest domain wall so that larger curvature (denoted red) reflects stronger toroidal order. IP-PFM phase images of identical concentric ring-shaped domains with the axis along vertical (e) and horizontal (f) measurement directions. The scale bar is 0.3 μm. The curl (g) and the divergence (h) of local polarization in the same area as e and f, revealing the polar spiral topology. i Schematic stereoscopic view of a CCW polar spiral, arrows represent regions of polarization. The red/blue arrows denote the polar source/sink that spirals in/out. The white arrows represent Néel rotation along the radial direction, as shown in more detail via the inset.

*Mengfan Guo, Erxiang Xu, Houbing Huang, Changqing Guo, Hetian Chen, Shulin Chen, Shan He, Le Zhou, Jing Ma, Zhonghui Shen, Ben Xu, Di Yi, Peng Gao, Ce-Wen Nan, Neil. D. Mathur and Yang Shen
Electrically and mechanically driven rotation of polar spirals in a relaxor ferroelectric polymer
Nature Communications volume 15, Article number: 348 (2024)
DOI: https://doi.org/10.1038/s41467-023-44395-5

The article “Electrically and mechanically driven rotation of polar spirals in a relaxor ferroelectric polymer” by Mengfan Guo, Erxiang Xu, Houbing Huang, Changqing Guo, Hetian Chen, Shulin Chen, Shan He, Le Zhou, Jing Ma, Zhonghui Shen, Ben Xu, Di Yi, Peng Gao, Ce-Wen Nan, Neil. D. Mathur and Yang Shen is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third-party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit https://creativecommons.org/licenses/by/4.0/.

Highly efficient carbon-dot-based photoinitiating systems for 3D-VAT printing

Known as a rising star among carbon nanomaterials, carbon dots (CDs) have attracted considerable interest in various fields in recent years.*

In the article “Highly efficient carbon dot-based photoinitiating systems for 3D-VAT printing” Dominika Krok, Wiktoria Tomal, Alexander J. Knight, Alexander I. Tartakovskii, Nicholas T. H. Farr, Wiktor Kasprzyk and Joanna Ortyl describe how they synthesized different types of carbon dots (CDs) based on citric acid as a precursor using an efficient procedure to purify these materials from low molecular by-products and fluorophores.*

They introduce three types of CDs: citric acid-based, as well as ammonia- and ethylenediamine-doped CDs, and compare their effectiveness to commercially available graphene-based CDs as an element of two- or three-component photoinitiating systems dedicated for free radical photopolymerization processes.*

This approach led to the development of efficient initiating systems and allowed better understanding of the mechanism according to which CDs performed in these processes. *

As the proof of concept, CDs-based photoinitiating systems were implemented in two types of 3D-VAT printing processes: DLP and DLW printing, to obtain high-resolution, 3D hydrogel materials. *

Dominika Krok et al. believe that the research presented in their article will become the basis for further work on carbon dots in the context of the diverse use of photopolymerization processes and avoid errors affecting the misinterpretation of data. *

The morphology and chemical composition of obtained hydrogel printouts were profoundly characterized via scanning electron microscopy (SEM), atomic force microscopy (AFM), nanoscale Fourier transform infrared spectroscopy (Nano-FTIR), and scattering-type Scanning Near-field Optical Microscopy (s-SNOM). *

The s-SNOM system used to collect the data shown in figure 12 of the article cited below, consisted of an AFM within one arm of an interferometer, and a moveable mirror in the other. *

A conductive platinum-iridium coated NanoWorld ARROW-EFM AFM probe was brought into tapping mode operation upon the sample (tapping frequency 77 kHz, tapping amplitude 71 nm), and illumination from a single-wavelength source outputting at 1490 cm−1 was sent into the interferometer. *

Under focused illumination, the conductive AFM tip acts as an optical antenna and a near field is generated at the AFM tip apex (AFM tip radius around 25 nm). The near field interacts with the sample surface and forms a scattering centre that scatters further incoming photons. *

The scattered photons were collected at the detector and interfered with photons returning from the movable mirror in the reference arm of the interferometer. This reference mirror was oscillated in order to induce side-band frequency mixing in the optical signal power spectrum, and the optical amplitude and phase data were extracted at the third harmonic of the AFM tapping frequency. *

The optical amplitude data were normalised to the maximum recorded value. The optical phase data were left unprocessed, and thus the raw values of the phase data in Fig. 12 (cited below) do not hold physical meaning. Only the contrast between two areas of Fig. 12 should be considered. *

AFM data: AFM topology data were recorded using the same instrument as used for the s-SNOM measurements. Conductive AFM cantilevers (Pt/Ir coated ARROW-EFM AFM probes from NanoWorld) were used, at a tapping frequency of 77 kHz and a tapping amplitude of 71 nm. *

Further surface characterization of the hydrogel samples performed with AFM and s-SNOM techniques revealed that, occasionally, carbon dot particles can be found at or emerging from the surface of the hydrogel. *

Fig. 12D presents the surface topography of an 8 μm by 6.8 μm region of hydrogel as measured through AFM, which is in keeping with the surface characterization data presented in Fig. 12A–C. It is not obvious from the topography data in Fig. 12D alone which features of the sample surface relate to carbon material. *

However, the carbon dot particles can be identified through the mechanical properties of their surface: Fig. 15E in the cited article presents the AFM phase data from the scan shown in Fig. 12D, with AFM phase being sensitive to various mechanical surface properties of the sample material such as hardness and adhesion. *

A strong phase contrast is observed between the soft hydrogel and the harder carbon dot material, allowing for the identification of a carbon dot particle that is only partially covered by the hydrogel. *

Additionally, Fig. 12F presents s-SNOM optical phase data taken during the scan shown in Fig. 12D, using illumination at 1490 cm−1. s-SNOM measurements are sensitive to optical properties such as refractive index and absorption, and the differences in these properties between the hydrogel and carbon dot materials creates strong contrast in s-SNOM phase data, allowing for further verification of the location of the carbon dot particle. *

Dominika Krok et al. note that often large areas of the hydrogel surface had to be scanned before any carbon dot particles partially above the surface were identified, and that no carbon dot particles were found either entirely or mostly above the surface of the hydrogel. *

It is therefore assumed that the CDs embedded within the 3D-VAT prints do not congregate on the surface of the material but instead are distributed throughout the matrix. *

Fig. 12 from “Highly efficient carbon dot-based photoinitiating systems for 3D-VAT printing” by Dominika Krok et al. (2023):(A) Low magnification secondary electron (SE) image of a 3D-VAT printout taken using an Everhart–Thornley Detector (ETD). (B) High resolution SE image of a 3D-VAT printout taken using a Through Lens Detector (TLD). (C) Backscattered election (BSE) image taken using a concentric backscatter (CBS) detector. (D): AFM height topography of a carbon dot at the surface of a hydrogel sample. (E) AFM mechanical phase data taken simultaneously with the data in (D). AFM phase data is sensitive to a number of surface properties (hardness, adhesion, etc.) and is often difficult to interpret. In this case, we simply note that the AFM phase contrast observed in (E) allows for easy distinction between areas of the hydrogel (high AFM phase) and the carbon dot surface (low AFM phase). (F): s-SNOM phase data taken simultaneously with the data in (D), with incident illumination at 1490 cm−1. The s-SNOM data was demodulated at the 3rd harmonic of the AFM tapping frequency to reduce the influence of background effects. The hydrogel and the carbon dot particle have different optical responses under the incident illumination, and so s-SNOM phase contrast is observed between the different regions of the AFM scan. Corresponding s-SNOM amplitude data is shown in Fig. S22 of the ESI.† The s-SNOM system used to collect the data shown in this figure consisted of an AFM within one arm of an interferometer, and a moveable mirror in the other. * A conductive platinum-iridium coated NanoWorld ARROW-EFM AFM probe was brought into tapping mode operation upon the sample (tapping frequency 77 kHz, tapping amplitude 71 nm), and illumination from a single-wavelength source outputting at 1490 cm−1 was sent into the interferometer. * — Fig. 12 from “Highly efficient carbon dot-based photoinitiating systems for 3D-VAT printing” by Dominika Krok et al. (2023):
(A) Low magnification secondary electron (SE) image of a 3D-VAT printout taken using an Everhart–Thornley Detector (ETD). (B) High resolution SE image of a 3D-VAT printout taken using a Through Lens Detector (TLD). (C) Backscattered election (BSE) image taken using a concentric backscatter (CBS) detector. (D): AFM height topography of a carbon dot at the surface of a hydrogel sample. (E) AFM mechanical phase data taken simultaneously with the data in (D). AFM phase data is sensitive to a number of surface properties (hardness, adhesion, etc.) and is often difficult to interpret. In this case, we simply note that the AFM phase contrast observed in (E) allows for easy distinction between areas of the hydrogel (high AFM phase) and the carbon dot surface (low AFM phase). (F): s-SNOM phase data taken simultaneously with the data in (D), with incident illumination at 1490 cm−1. The s-SNOM data was demodulated at the 3rd harmonic of the AFM tapping frequency to reduce the influence of background effects. The hydrogel and the carbon dot particle have different optical responses under the incident illumination, and so s-SNOM phase contrast is observed between the different regions of the AFM scan. Corresponding s-SNOM amplitude data is shown in Fig. S22 of the ESI.†

*Dominika Krok, Wiktoria Tomal, Alexander J. Knight, Alexander I. Tartakovskii, Nicholas T. H. Farr, Wiktor Kasprzyk and Joanna Ortyl
Highly efficient carbon dot-based photoinitiating systems for 3D-VAT printing
Polymer Chemistry, 2023, 14, 4429-4444
DOI: https://doi.org/10.1039/D3PY00726J

The article “Highly efficient carbon dot-based photoinitiating systems for 3D-VAT printing” by Dominika Krok, Wiktoria Tomal, Alexander J. Knight, Alexander I. Tartakovskii, Nicholas T. H. Farr, Wiktor Kasprzyk and Joanna Ortyl is licensed under a Creative Commons Attribution 3.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third-party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit https://creativecommons.org/licenses/by/3.0/.