You’re welcome to visit our booth no. 243 at the China Nano 2015 from September 3-5, 2015 in Beijing this week.
Visit our booth at China Nano 2015 in Beijing this week
Tag: atomic force microscopy
NANOWORLD POINTPROBE® HIGH ASPECT RATIO TIP (AR5 / AR5T) SCREENCAST
Check out our screencast about NanoWorld Pointprobe® High Aspect Ratio (AR5 / AR5T) Tip.
It will give you an overview of our High Aspect Ratio (AR5 / AR5T) tip which has been developed for measurements on samples with sidewall angles approaching 90°, e.g. deep trench measurements or other semiconductor applications.
NANOWORLD POINTPROBE® SUPERSHARPSILICON™ TIP (SSS) SCREENCAST
Check out our screencast about NanoWorld Pointprobe® SuperSharpSilicon™ (SSS) Tip.
It will give you an overview of our SuperSharpSilicon™ (SSS) tip which has been developed for enhanced resolution of microroughness and nanostructures.