Tag: atomic force microscopy

NANOWORLD ARROW™ TL – TIPLESS CANTILEVERS AND CANTILEVER ARRAYS SCREENCAST

Check out our screencast about NanoWorld Arrow™ TL – Tipless Cantilevers and Cantilever Arrays

It will give you an overview of our Arrow™ TL Probes which have tipless cantilevers and are available with either 1 cantilever or with cantilever arrays consisting of 2 or 8 rectangular cantilevers. The AFM probes of the Arrow tipless series can for example be used for attaching spheres and other objects to the free end of the cantilever, or for functionalizing and sensing applications.

Ice Crystallization on Mica – High Speed AFM

A new video showing ice crystallization on mica using NanoWorld Arrow UHF AFM probes in a Keysight 9500 Atomic Force Microscope (AFM) has been published on the NanoWorld High Speed Scanning website. Have a look here: