Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Researchers from the Physics Department at Durham University demonstrate an imaging technique using Atomic Force Microscopy in their JoVE Engineering publication.

For each step, the authors have explained the scientific rationale behind their choices to facilitate the adaptation of the methodology to every user’s specific system.

The NanoWorld Arrow-UHF AFM probe for high speed AFM is also mentioned in this publication.

Ethan J. Miller, William Trewby, Amir Farokh Payam, Luca Piantanida, Clodomiro Cafolla, Kislon  Voïtchovsky, Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid (2016), JoVE, 1940-087X, doi:10.3791/54924

https://www.jove.com/video/54924/sub-nanometer-resolution-imaging-with-amplitude-modulation-atomic

AM-AFM images of hard samples in fluid solutions
AM-AFM images of hard samples in fluid solutions. – figure from Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid Jove.com – please refer to link above for the full article

 

Creative Commons Attribution
https://doi.org/10.3791/54924
Copyright © 2016 Creative Commons Attribution 3.0 License

Zoom zoom: High speed AFM imaging

The NanoWorld Arrow UHF was mentioned in this blog article on Microscopy and Analysis http://www.microscopy-analysis.com/blog/blog-articles/zoom-zoom-high-speed-afm-imaging

NanoWorld Arrow UHF AFM tip for high speed atomic force microscopy
3D view of NanoWorld Arrow UHF AFM tip for high speed AFM

Ultra-short Cantilevers for High Speed AFM – USC

If you would like to see what has been going on in the last few years in the field of high speed AFM then have a look at: http://www.highspeedscanning.com/hs-afm-references.html

We know that this list is far from complete so if you have used one of our USC tips in the research for your publication and your article isn’t listed yet then please let us know.

NanoWorld USC AFM tip for high-speed AFM
NanoWorld ultra-short AFM probes for high-speed atomic force microscopy