Tag: AFM probes

nano tech 2019 conference and exhibition – Tokyo Big Sight, Japan

We are currently meeting customers at the nano tech 2019, the international nanotechnology exhibition and conference at Tokyo Big Sight, January 30 – February 1, 2019.

See you at booth 4T-13 of Toyo Corporation, our distributor in Japan!

NanoWorld AFM probes CEO Manfred Detterbeck at the nanotech 2019
NanoWorld AG CEO Manfred Detterbeck at the nanotech 2019

Self-assembled PCBM bilayers on graphene and HOPG examined by AFM and STM

In the article «Self-assembled PCBM bilayers on graphene and HOPG examined by AFM and STM” Yanlong Li, Chuanhui Chen, John Burton, Kyungwha Park, James R Heflin and Chenggang Tao demonstrate that PCBM molecules self-assemble into bilayer structures on graphene and HOPG substrates. They used Atomic Force Microscopy (AFM) and Scanning Tunneling Microscopy (STM), and analyzed the observed morphology by comparison to molecular models.*

The AFM measurements were carried out in a dark environment. NanoWorld™ Pointprobe® NCST AFM probes were used in soft tapping mode and simultaneous height and phase images were acquired and reproduced across multiple samples.*

The results of this study shed light on improvement of the energy efficiency in solar cells containing graphene and organic molecules, by increasing the donor–acceptor interface area and could provide valuable insight into fabrication of new hybrid, ordered structures for applications to organic solar cells.*

Figure 5. from “Self-assembled PCBM bilayers on graphene and HOPG examined by AFM and STM” by Yanlong Li et al.: AFM images of PCBM bilayer and size distributions of holes at different conditions. (a) AFM image of a PCBM bilayer before annealing. (b) AFM image of a PCBM bilayer after annealing at 140 °C. (c) AFM image of a PCBM bilayer after annealing at 160 °C. (d) Area distribution histogram of holes (without PCBM area) obtained from measurements of the area of holes in AFM images of before (green) and after annealing at 140 °C (dark red) and 160 °C (dark blue). Monolithic silicon cantilevers (NCST, NANO WORLD) with a spring constant of 7.4 N m−1, first longitudinal resonance frequencies between 120 and 205 kHz, and nominal tip radius of 8 nm were employed in soft tapping mode. Simultaneous height and phase images were acquired and reproduced across multiple samples.
Figure 5. from “Self-assembled PCBM bilayers on graphene and HOPG examined by AFM and STM” by Yanlong Li et al.: AFM images of PCBM bilayer and size distributions of holes at different conditions. (a) AFM image of a PCBM bilayer before annealing. (b) AFM image of a PCBM bilayer after annealing at 140 °C. (c) AFM image of a PCBM bilayer after annealing at 160 °C. (d) Area distribution histogram of holes (without PCBM area) obtained from measurements of the area of holes in AFM images of before (green) and after annealing at 140 °C (dark red) and 160 °C (dark blue).

*Yanlong Li, Chuanhui Chen, John Burton, Kyungwha Park, James R Heflin, Chenggang Tao
Self-assembled PCBM bilayers on graphene and HOPG examined by AFM and STM
Nanotechnology, Volume 29, Number 18 (2018)
DOI: https://doi.org/10.1088/1361-6528/aab00a

Open Access The article “Self-assembled PCBM bilayers on graphene and HOPG examined by AFM and STM” by Yanlong Li et al. is licensed under a Creative Commons Attribution 3.0 International License. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI. To view a copy of this license, visit https://creativecommons.org/licenses/by/3.0/