You’re welcome to visit our booth no. 243 at the China Nano 2015 from September 3-5, 2015 in Beijing this week.
Visit our booth at China Nano 2015 in Beijing this week
Tag: AFM Probe
Visit NanoWorld at the IMRC 2015 this week
You’re cordially invited to visit our booth T5 at the IMRC 2015 in Cancun this week. Mr. Manfred Detterbeck, CEO of NanoWorld, will join us there for the duration of the conference and the exhibition.
Le invitamos a visitar nuestro stand en IMRC 2015 Manfred Detterbeck, director general de NanoWorld, estará con nosotros durante el congreso y la exposition.
NANOWORLD POINTPROBE® HIGH ASPECT RATIO TIP (AR5 / AR5T) SCREENCAST
Check out our screencast about NanoWorld Pointprobe® High Aspect Ratio (AR5 / AR5T) Tip.
It will give you an overview of our High Aspect Ratio (AR5 / AR5T) tip which has been developed for measurements on samples with sidewall angles approaching 90°, e.g. deep trench measurements or other semiconductor applications.