Rapid changes in tissue mechanics regulate cell behaviour in the developing embryonic brain

In their short report “Rapid changes in tissue mechanics regulate cell behaviour in the developing embryonic brain” published in January 2019, Amelia J Thompson, Eva K Pillai, Ivan B Dimov, Sarah K Foster, Christine E Holt, and Kristian Franze describe how they used time-lapse in vivo atomic force microscopy (tiv-AFM), a method that combines sensitive upright epi-fluorescence imaging of opaque samples, with iterated AFM indentation measurements of in vivo tissue at cellular resolution and at a time scale of tens of minutes, in order to enable time-resolved measurements of developmental tissue mechanics.*

The technique developed by Thompson, Pillai et al. is a useful tool that can help elucidate how variations in stiffness control the brain wiring process. It could also be used to look into how other developmental or regenerative processes, such as the way neurons reconnect after injuries to thebrain or spinal cord, may be regulated by mechanical tissue properties.*

NanoWorld Arrow-TL1 tipless cantilevers were used for the AFM-based stiffness measurements. (Monodisperse spherical polystyrene beads were glued to the cantilever ends as probes.)

NanoWorld Arrow-TL1 tipless cantilever for atomic force microscopy
NanoWorld Arrow-TL1 tipless AFM cantilever

*Amelia J Thompson, Eva K Pillai, Ivan B Dimov, Sarah K Foster, Christine E Holt, Kristian Franze
Rapid changes in tissue mechanics regulate cell behaviour in the developing embryonic brain
eLife 2019; 8:e39356
DOI: https://doi.org/10.7554/eLife.39356

Please follow this external link to the full article: https://cdn.elifesciences.org/articles/39356/elife-39356-v1.pdf

Open Access: The article « Rapid changes in tissue mechanics regulate cell behaviour in the developing embryonic brain » by Amelia J Thompson et al. is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

 

NanoWorld™ appoints NanoAndMore Japan as a distributor for Japan

In a further move to extend its worldwide network of distribution partners NanoWorld™ today has appointed the recently founded NanoAndMore Japan KK (NanoAndMore ジャパン ) as a distributor of its line of probes for Atomic Force Microscopy (AFM) and Scanning Probe Microscopy (SPM) in Japan.

NanoAndMore Japan will keep a large stock of NanoWorld AFM probes on site enabling a fast delivery and will sell NanoWorld AFM probes at manufacturer recommended prices.

NanoWorld™ is convinced that this addition to the already existing distribution network will work for the benefit of its customers.

NanoAndMore ジャパン CEO Mr. Nobuhiro Saito has many years of AFM expertise and is looking forward to assisting customers with the selection of the right AFM probes for their various application needs.

Please refer to the contact data below or to our list of distributors on the “how to buy” page on the NanoWorld webpage.

NanoAndMore ジャパン
201 KTT5 Building, 1-1-1 Waseda, Misato-shi
Saitama-ken 341-0018
Japan

Phone: +81 (48) 951-0958

Contact: Mr. Nobuhiro Saito
info@nanoandmore.jp
www.nanoandmore.jp

NanoWorld Ultra-Short-Cantilevers (USC) - AFM tips for video rate atomic force microscopy
NanoWorld Ultra-Short Cantilevers (USC) for High-Speed AFM (HS-AFM)

Meet us at MRS Fall 2018 this week

Got questions about AFM probes that you’ve always wantend to ask? You’re welcome to pass by NanoAndMore USA booth no. 610 at the 2018 MRS Fall Exhibit this week and meet NanoWorld CEO Manfred Detterbeck there.

NanoWorld AFM probes CEO Manfred Detterbeck at NanoAndMore USA booth no. 610 at MRS Fall 2018
NanoWorld CEO Manfred Detterbeck at NanoAndMore USA booth no. 610 at MRS Fall 2018