Tag: AFMカンチレバー

Piezoelectric property of PZT nanofibers characterized by resonant piezo-force microscopy

Nano-piezoelectric materials such as 1D piezoelectric nanofibers, nanowires, and nanobelts have attracted a lot of research interest in recent years. *

Because of their active property that can transform strain energy into electricity, 1D piezoelectric nano-materials can be building blocks for nano-generators, strain sensors, acoustic sensors, force sensors, biosensors, self-powered drug delivery systems, piezoelectric transistors and other intelligent systems. *

The most important property of these active materials is their ability to convert mechanical energy into electrical energy and vice versa. *

Therefore, researchers started developing nano-sized piezoelectric materials in hope of achieving better piezoelectric properties. *

The characterization of these piezoelectric properties, especially measuring the piezoelectric strain coefficients, remains a challenge. *

The Atomic Force Microscopy (AFM)-based method to directly measure nano-materials’ piezoelectric strain coefficients is widely used.

However, several factors such as the extremely small piezoelectric deformation, the influence from the parasitic electrostatic force, and the environmental noise can make the measurement results questionable. *

In the article “Piezoelectric property of PZT nanofibers characterized by resonant piezo-force microscopy” Guitao Zhang, Xi Chen, Weihe Xu, Wei-Dong Yao, and Yong Shi address these issues by introducing a resonant piezo-force microscopy method and describing how it was used to accurately measure the piezoelectric deformation from 1D piezoelectric nanofibers. *

During the measurement the AFM tip was brought into contact with the piezoelectric sample and set to work close to the AFM tip’s first resonant frequency. *

The AFM probe used in this test was a platinum iridium coated NanoWorld Arrow-CONTPt (typical force constant 0.2 N/m, typical resonant frequency 14 KHz. The PtIr coating makes the AFM tip conductive and at the same time enhances the laser reflection from the detector facing side of the AFM cantilever to the photodetector. *

A lock-in amplifier was used to pick up the sample’s deformation signal at the testing frequency. By using this technique, the piezoelectric strain constant d33 of the Lead Zirconate Titanate (PZT) nanofiber with a diameter of 76 nm was measured. The result showed that d33 of this PZT nanofiber was around 387 pm/V. Meanwhile, by tracking the piezoelectric deformation phase image, domain structures inside PZT nanofibers were identified. *

Figure 5 from “Piezoelectric property of PZT nanofibers characterized by resonant piezo-force microscopy” by Guitao Zhang et al. : Piezoelectric deformation amplitude image from a PZT nanofiber on a silicon dioxide substrate (a) and its cross-sectional view along the horizontal direction (b). Conductive NanoWorld Arrow-CONTPt AFM probes were used for the resonant piezo-force microscopy
Figure 5 from “Piezoelectric property of PZT nanofibers characterized by resonant piezo-force microscopy” by Guitao Zhang et al. :
Piezoelectric deformation amplitude image from a PZT nanofiber on a silicon dioxide substrate (a) and its cross-sectional view along the horizontal direction (b).

 

Figure 6 from “Piezoelectric property of PZT nanofibers characterized by resonant piezo-force microscopy” by Guitao Zhang et al. : (a) Piezoelectric deformation phase image from a PZT nanofiber on the silicon dioxide substrate and its 3D image (b). NanoWorld Arrow-CONTPt platinum iridium 5 coated AFM probes were used.
Figure 6 from “Piezoelectric property of PZT nanofibers characterized by resonant piezo-force microscopy” by Guitao Zhang et al. :
(a) Piezoelectric deformation phase image from a PZT nanofiber on the silicon dioxide substrate and its 3D image (b).

*Guitao Zhang, Xi Chen, Weihe Xu, Wei-Dong Yao and Yong Shi
Piezoelectric property of PZT nanofibers characterized by resonant piezo-force microscopy
AIP Advances 12, 035203 (2022)
DOI: https://doi.org/10.1063/5.0081109

The article “Piezoelectric property of PZT nanofibers characterized by resonant piezo-force microscopy” by Guitao Zhang, Xi Chen, Weihe Xu, Wei-Dong Yao and Yong Shi is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit https://creativecommons.org/licenses/by/4.0/.

Atomistic insights into highly active reconstructed edges of monolayer 2H-WSe 2 photocatalyst

Today, October 9, 2022, is National #NanotechnologyDay in the US. The theme for this year’s National Nanotechnology Day is nanotechnology’s role in understanding and responding to climate change and improving the health of the Earth and its people.

Climate change has necessitated the framing of government regulations and the development of green strategies for reducing CO2 emissions. Scientists worldwide are engaged in efforts to find sustainable solutions to the problem of CO2 level in the air.*

Ascertaining the function of in-plane intrinsic defects and edge atoms is necessary for developing efficient low-dimensional photocatalysts.*

In their article “Atomistic insights into highly active reconstructed edges of monolayer 2H-WSe 2 photocatalyst” Mohammad Qorbani , Amr Sabbah, Ying-Ren Lai, Septia Kholimatussadiah, Shaham Quadir , Chih-Yang Huang, Indrajit Shown, Yi-Fan Huang, Michitoshi Hayashi, Kuei-Hsien Chen and Li-Chyong Chen report the wireless photocatalytic CO2 reduction to CH4 over reconstructed edge atoms of monolayer 2H-WSe2 artificial leaves.*

Their first-principles calculations demonstrate that reconstructed and imperfect edge configurations enable CO2 binding to form linear and bent molecules. Experimental results show that the solar-to-fuel quantum efficiency is a reciprocal function of the flake size. It also indicates that the consumed electron rate per edge atom is two orders of magnitude larger than the in-plane intrinsic defects. Further, nanoscale redox mapping at the monolayer WSe2–liquid interface confirms that the edge is the most preferred region for charge transfer.*

The author’s results pave the way for designing a new class of monolayer transition metal dichal-cogenides with reconstructed edges as a non-precious co-catalyst for wired or wireless hydrogen evolution or CO2 reduction reactions.*

The thickness of the WSe 2 flake was measured by using Atomic Force Microscopy with a NanoWorld Pointprobe® NCHR AFM probe and was controlled by a feedback mechanism. The AFM cantilever was driven under a resonant frequency of ~330 kHz and 42 N m−1 spring constant.*

Figure 4 from “Atomistic insights into highly active reconstructed edges of monolayer 2H-WSe2 photocatalyst” by Mohammad Qorbani et al: Nanoscale redox mapping and PC performance a FE-SEM image of the ML WSe2 in dark (control experiment) in the solution containing Ag ions. b FE-SEM images of the ML WSe2 under light after Ag photodeposition for 1 h, respectively. Bright regions show the presence of Ag nanoparticles. Inset illustrates the photoreduction mechanism. Scale bar = 2 μm. c–e AFM height profile measured in the liquid environment, background normalized SECM feedbacks maps for main, and lift scans, respectively. Scale bar = 1 μm. f Color map of the blank-corrected total methane yield as a function of flake sizes (in perimeters) and areas. g Blank-corrected IQE as a function of the average flake perimeter. The black line shows the fitted reciprocal curve. h Stability test for six cycles. Irradiation time for each cycle is 4 h. NanoWorld Pointprobe NCHR AFM probes were used for the atomic force microscopy
Figure 4 from “Atomistic insights into highly active reconstructed edges of monolayer 2H-WSe2 photocatalyst” by Mohammad Qorbani et al:
Nanoscale redox mapping and PC performance
a FE-SEM image of the ML WSe2 in dark (control experiment) in the solution containing Ag ions. b FE-SEM images of the ML WSe2 under light after Ag photodeposition for 1 h, respectively. Bright regions show the presence of Ag nanoparticles. Inset illustrates the photoreduction mechanism. Scale bar = 2 μm. c–e AFM height profile measured in the liquid environment, background normalized SECM feedbacks maps for main, and lift scans, respectively. Scale bar = 1 μm. f Color map of the blank-corrected total methane yield as a function of flake sizes (in perimeters) and areas. g Blank-corrected IQE as a function of the average flake perimeter. The black line shows the fitted reciprocal curve. h Stability test for six cycles. Irradiation time for each cycle is 4 h.

*Mohammad Qorbani , Amr Sabbah, Ying-Ren Lai, Septia Kholimatussadiah, Shaham Quadir , Chih-Yang Huang, Indrajit Shown, Yi-Fan Huang, Michitoshi Hayashi, Kuei-Hsien Chen and Li-Chyong Chen
Atomistic insights into highly active reconstructed edges of monolayer 2H-WSe 2 photocatalyst
Nature communications (2022) 13:1256
DOI:  https://doi.org/10.1038/s41467-022-28926-0

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Open Access
The article “Atomistic insights into highly active reconstructed edges of monolayer 2H-WSe 2 photocatalyst” by Mohammad Qorbani , Amr Sabbah, Ying-Ren Lai, Septia Kholimatussadiah, Shaham Quadir , Chih-Yang Huang, Indrajit Shown, Yi-Fan Huang, Michitoshi Hayashi, Kuei-Hsien Chen and Li-Chyong Chen is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.