NanoWorld AG introduces Ultra-Short Cantilevers for High-Speed Atomic Force Microscopy (HS-AFM)

Neuchâtel, February 19th 2014, NanoWorld AG today announced the official commercialization of six types of Ultra-Short Cantilevers (USC) dedicated for use in High-Speed Atomic Force Microscopy (HS-AFM). High Speed Atomic Force Microscopy is a quickly evolving technique within the field of Scanning Probe Microscopy that enables the users of dedicated instruments and AFM probes to … Continue reading NanoWorld AG introduces Ultra-Short Cantilevers for High-Speed Atomic Force Microscopy (HS-AFM)

New Product Screencast NanoWorld Ultra-Short Cantilevers (USC) for High Speed Scanning

Please watch the new product screencast on the NanoWorld Ultra-Short Cantilevers (USC) given by our Head of Product Development Mathieu Burri at www.youtube.com Product Screencast on the NanoWorld Ultra-Short Cantilevers (USC) given by Mathieu Burri, Head of Product Development. Ultra-Short Cantilevers (USC) combine very small cantilevers capable of resonating at frequencies up to 5 MHz … Continue reading New Product Screencast NanoWorld Ultra-Short Cantilevers (USC) for High Speed Scanning

NanoWorld AG announces High Speed Scanning AFM website

Neuchâtel, June 1 st 2011, NanoWorld AG announced that it has launched a website entirely dedicated to High Speed Scanning Atomic Force Microscopy (HS-AFM) at www.highspeedscanning.com. NanoWorld dedicates this website to the community of high speed scanning AFM users and focuses on the probe aspect of high speed scanning SPM. For a long time Fast … Continue reading NanoWorld AG announces High Speed Scanning AFM website