HYBRID-NITRIDE AFM PROBES for Contact Mode are now available
General
- contact mode SPM probe for wide range of applications
- fits to all well-known commercial SPMs
- silicon nitride cantilevers and tips
- cantilevers are supported by a holder chip made of SU-8 epoxy (hybrid design)
- suitable for operation in liquids
Material Features
- low-stress silicon nitride for lowest cantilever bending
- excellent hardness for wear resistance and extended lifetime
- SU-8 epoxy allowing for single holder design
Cantilever
- multi-lever design with two rectangular and two triangular cantilevers
- reflective chromium / titanium/ gold coating on the backside of the cantilevers
- stress compensated with bending below 3°
Support Chip
- made of SU-8 epoxy material (3.4mm x 1.5mm x 0.2mm)
- beveled corner design avoids mechanical contact between chip and sample
- notch design for clear indication of cantilever type (notch near triangular cantilevers)
- easy handling due to single holder chip
Tip
- oxide sharpened pyramidal probe tip
- tip height 3.5 µm and tip radius of curvature typically < 15 nm
- macroscopic half-cone angles 35°
Package sizes
- 20 and 50 probes