Thank you for visiting our booth at the ISPM 2016 in Grindelwald, Switzerland. We hope to see you at another conference soon.
Thank you for visiting our booth at the ISPM 2016 in Grindelwald, Switzerland. We hope to see you at another conference soon.
We will be attending the International Scanning Probe Microscopy Conference (ISPM) 2016 in Grindelwald, Switzerland from June 12 – 15, 2016. Will you be there too? #ISPM
For the research for this article a NanoWorld Arrow-UHFAuD AFM probe was used. Click here to view the full publication: Visualisation of xanthan conformation by atomic force microscopy
Direct visual evidence obtained by atomic force microscopy demonstrates that when xanthan is adsorbed from aqueous solution onto the heterogeneously charged substrate mica, its helical conformation is distorted. Following adsorption it requires annealing for several hours to restore its ordered helical state. Once the helix state reforms, the AFM images obtained showed clear resolution of the periodicity with a value of 4.7 nm consistent with the previously predicted models. In addition, the images also reveal evidence that the helix is formed by a double strand, a clarification of an ambiguity of the xanthan ultrastructure that has been outstanding for many years.
Open Access funded by Biotechnology and Biological Sciences Research Council Under a Creative Commons license