The screencast about NanoWorld AFM probes for Magnetic Force Microscopy held by Dr. Marco Becker has just passed the 1500 views mark. Congratulations Marco!
Magnetic Force Microcopy is a type of Atomic Force Microscopy in which a magnetised AFM tip is used to measure magnetic interactions between the tip and the surface of a magnetic sample. These detected interactions are then used to reconstruct the magnetic structure of the sample surface
NanoWorld currently offers two types of MFM tips:
– MFMR – This type of magnetic AFM tip is coated with a hard magnetic coating on the tip side and yields a very high force sensitivity, while simultaneously enabling tapping and lift mode operation.
– S-MFMR – These magnetic AFM tips are coated with a soft magnetic layer on the tip side and are designed for the measurement of magnetic domains in soft magnetic samples.
The properties of a polymer change significantly depending on the structure of the polymer chain, particularly, with branched structures, depending on the number of branches and the length of the branch.* However, the long-chain branch (LCB) structure of polyethylene was unclear, due particularly to the complex polymer structure and the limitations of its analysis methods.
In their study “Direct Observation of Long-Chain Branches in a Low-Density Polyethylene” Ken-ichi Shinohara, Masahiro Yanagisawa and Yuu Makida measured the chain length of LCBs and the distance between branch points of LDPE by atomic force microscopy.*
Open Access: The article «Direct Observation of Long-Chain Branches in a Low-Density Polyethylene» by Ken-ichi Shinohara, Masahiro Yanagisawa and Yuu Makida is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.
It’s the second day for the exhibition at the Microscience Microscopy Congress 2019 (MMC 2019) in Manchester. Have you already had a chance to visit Apex Probes our new distributor for the UK and Ireland in the newcomer area no. 601? They are ready to welcome you and discuss all your application needs for Atomic Force Microscopy.