Videos

Actin filaments on Mica with APTES

Courtesy of Prof. Noriyuki Kodera, nanoLSI, Kanazawa University, Japan we could upload two new images and a very nice High Speed Atomic Force Microscopy (HS-AFM) video of Actin filaments on Mica with APTES to the image gallery and the video gallery on https://www.highspeedscanning.com/.

NanoWorld USC-F1.2-k0.15 Ultra-Short AFM cantilevers [C = 0.15 N/m; fo = 1200 kHz] were used for the high speed imaging.

HS-AFM Images of actin filaments on Mica with APTES. Buffer:100 mM KCl, 2 mM MgCl2, 1 mM EGTA, 20 mM Imidazole-HCl, pH7.6 (a) 250×250 nm2 and (b) 400×400 nm2. Image courtesy of Prof. Kodera, nanoLSI, Kanazawa University, Japan. NanoWorld USC-F1.2-k0.15 AFM probes from the Ultra-Short Cantilever (USC) series were used for the High Speed Atomic Force Microscopy — HS-AFM Images of actin filaments on Mica with APTES. Buffer:100 mM KCl, 2 mM MgCl2, 1 mM EGTA, 20 mM Imidazole-HCl, pH7.6 (a) 250×250 nm2 and (b) 400×400 nm2. Images courtesy of Prof. Kodera, nanoLSI, Kanazawa University, Japan. NanoWorld USC-F1.2-k0.15 AFM probes were used for the High Speed Atomic Force Microscopy

The HighSpeedScanning webpage is dedicated to presenting information about ultra high frequency AFM probe solutions for High Speed AFM ranging from already commercialized AFM probes such as the Arrow^TM UHF and NanoWorld Ultra-Short Cantilever (USC) series to AFM probes that are still under development.

Additionally to the High-Speed AFM images and videos researchers worldwide kindly have provided us with so that we can share them with the whole High Speed AFM community you will also find a list of links and references dedicated to High-Speed AFM on https://www.highspeedscanning.com/high-speed-scanning.html

We are aware that these lists are far from complete and we are constantly working on keepting them up to date. If your research institute or company is working with High Speed AFM (HS-AFM) using our AFM probes or if you have published articles with images that were achieved with our High Speed AFM probes annd you find that are missing from our list then please let us know via email: info@highspeedscanning.com if you would like us to add them to the list of references .

Optimized positioning through maximized tip visibility – Arrow AFM probes screencast passes 500 views mark

The screencast about NanoWorld Arrow Silicon AFM probes held byNanoWorld AG CEO Manfred Detterbeck has just passed the 500 views mark. Congratulations Manfred!

NanoWorld Arrow™ AFM probes are designed for easy AFM tip positioning and high resolution AFM imaging and are very popular with AFM users due to the highly symetric scans that are possible with these AFM probes because of their special tip shape. They fit to all well-known commercial SPMs (Scanning Probe Microscopes) and AFMs (Atomic Force Microscopes). The Arrow AFM probe consists of an AFM probe support chip with an AFM cantilever which has a tetrahedral AFM tip at its triangular free end.

The Arrow AFM probe is entirely made of monolithic, highly doped silicon.

The unique Arrow™ shape of the AFM cantilever with the AFM tip always placed at the very end of the AFM cantilever allows easy positioning of the AFM tip on the area of interest.
The Arrow AFM probes are available for non-contact mode, contact mode and force modulation mode imaging and are also available with a conductive platinum iridum coating. Furthermore the Arrow™ AFM probe series also includes a range of tipless AFM cantilevers and AFM cantilever arrays as well as dedicated ultra-high frequency Arrow AFM probes for high speed AFM.

To find out more about the different variations please have a look at:

https://www.nanoworld.com/arrow-afm-tips

You can also find various application examples for the Arrow AFM probes in the NanoWorld blog. For a selection of these articles just click on the “Arrow AFM probes” tag on the bottom of this blog entry.

AFM probes for Magnetic Force Microscopy – screencast on NanoWorld MFM tips passes 2000 views mark

The screencast about NanoWorld AFM probes for Magnetic Force Microscopy held by Dr. Marco Becker has just passed the 2000 views mark. Congratulations Marco!

Magnetic Force Microscopy is a type of Atomic Force Microscopy in which a magnetised AFM tip is used to measure magnetic interactions between the tip and the surface of a magnetic sample. These detected interactions are then used to reconstruct the magnetic structure of the sample surface

NanoWorld currently offers two types of MFM tips:

– MFMR – This type of magnetic AFM tip is coated with a hard magnetic coating on the tip side and yields a very high force sensitivity, while simultaneously enabling tapping and lift mode operation.

– S-MFMR – These magnetic AFM tips are coated with a soft magnetic layer on the tip side and are designed for the measurement of magnetic domains in soft magnetic samples.