Check out our screencast about NanoWorld Pointprobe® High Aspect Ratio (AR5 / AR5T) Tip.
It will give you an overview of our High Aspect Ratio (AR5 / AR5T) tip which has been developed for measurements on samples with sidewall angles approaching 90°, e.g. deep trench measurements or other semiconductor applications.
This is what it looks like when we are celebrating the first successful test of a new AFM probe prototype in the AFM. Want to find out how the story continues? Stay tuned…
Check out our screencast about NanoWorld Pointprobe® SuperSharpSilicon™ (SSS) Tip.
It will give you an overview of our SuperSharpSilicon™ (SSS) tip which has been developed for enhanced resolution of microroughness and nanostructures.