June 2024

Highly efficient carbon-dot-based photoinitiating systems for 3D-VAT printing

Known as a rising star among carbon nanomaterials, carbon dots (CDs) have attracted considerable interest in various fields in recent years.*

In the article “Highly efficient carbon dot-based photoinitiating systems for 3D-VAT printing” Dominika Krok, Wiktoria Tomal, Alexander J. Knight, Alexander I. Tartakovskii, Nicholas T. H. Farr, Wiktor Kasprzyk and Joanna Ortyl describe how they synthesized different types of carbon dots (CDs) based on citric acid as a precursor using an efficient procedure to purify these materials from low molecular by-products and fluorophores.*

They introduce three types of CDs: citric acid-based, as well as ammonia- and ethylenediamine-doped CDs, and compare their effectiveness to commercially available graphene-based CDs as an element of two- or three-component photoinitiating systems dedicated for free radical photopolymerization processes.*

This approach led to the development of efficient initiating systems and allowed better understanding of the mechanism according to which CDs performed in these processes. *

As the proof of concept, CDs-based photoinitiating systems were implemented in two types of 3D-VAT printing processes: DLP and DLW printing, to obtain high-resolution, 3D hydrogel materials. *

Dominika Krok et al. believe that the research presented in their article will become the basis for further work on carbon dots in the context of the diverse use of photopolymerization processes and avoid errors affecting the misinterpretation of data. *

The morphology and chemical composition of obtained hydrogel printouts were profoundly characterized via scanning electron microscopy (SEM), atomic force microscopy (AFM), nanoscale Fourier transform infrared spectroscopy (Nano-FTIR), and scattering-type Scanning Near-field Optical Microscopy (s-SNOM). *

The s-SNOM system used to collect the data shown in figure 12 of the article cited below, consisted of an AFM within one arm of an interferometer, and a moveable mirror in the other. *

A conductive platinum-iridium coated NanoWorld ARROW-EFM AFM probe was brought into tapping mode operation upon the sample (tapping frequency 77 kHz, tapping amplitude 71 nm), and illumination from a single-wavelength source outputting at 1490 cm−1 was sent into the interferometer. *

Under focused illumination, the conductive AFM tip acts as an optical antenna and a near field is generated at the AFM tip apex (AFM tip radius around 25 nm). The near field interacts with the sample surface and forms a scattering centre that scatters further incoming photons. *

The scattered photons were collected at the detector and interfered with photons returning from the movable mirror in the reference arm of the interferometer. This reference mirror was oscillated in order to induce side-band frequency mixing in the optical signal power spectrum, and the optical amplitude and phase data were extracted at the third harmonic of the AFM tapping frequency. *

The optical amplitude data were normalised to the maximum recorded value. The optical phase data were left unprocessed, and thus the raw values of the phase data in Fig. 12 (cited below) do not hold physical meaning. Only the contrast between two areas of Fig. 12 should be considered. *

AFM data: AFM topology data were recorded using the same instrument as used for the s-SNOM measurements. Conductive AFM cantilevers (Pt/Ir coated ARROW-EFM AFM probes from NanoWorld) were used, at a tapping frequency of 77 kHz and a tapping amplitude of 71 nm. *

Further surface characterization of the hydrogel samples performed with AFM and s-SNOM techniques revealed that, occasionally, carbon dot particles can be found at or emerging from the surface of the hydrogel. *

Fig. 12D presents the surface topography of an 8 μm by 6.8 μm region of hydrogel as measured through AFM, which is in keeping with the surface characterization data presented in Fig. 12A–C. It is not obvious from the topography data in Fig. 12D alone which features of the sample surface relate to carbon material. *

However, the carbon dot particles can be identified through the mechanical properties of their surface: Fig. 15E in the cited article presents the AFM phase data from the scan shown in Fig. 12D, with AFM phase being sensitive to various mechanical surface properties of the sample material such as hardness and adhesion. *

A strong phase contrast is observed between the soft hydrogel and the harder carbon dot material, allowing for the identification of a carbon dot particle that is only partially covered by the hydrogel. *

Additionally, Fig. 12F presents s-SNOM optical phase data taken during the scan shown in Fig. 12D, using illumination at 1490 cm−1. s-SNOM measurements are sensitive to optical properties such as refractive index and absorption, and the differences in these properties between the hydrogel and carbon dot materials creates strong contrast in s-SNOM phase data, allowing for further verification of the location of the carbon dot particle. *

Dominika Krok et al. note that often large areas of the hydrogel surface had to be scanned before any carbon dot particles partially above the surface were identified, and that no carbon dot particles were found either entirely or mostly above the surface of the hydrogel. *

It is therefore assumed that the CDs embedded within the 3D-VAT prints do not congregate on the surface of the material but instead are distributed throughout the matrix. *

Fig. 12 from “Highly efficient carbon dot-based photoinitiating systems for 3D-VAT printing” by Dominika Krok et al. (2023):(A) Low magnification secondary electron (SE) image of a 3D-VAT printout taken using an Everhart–Thornley Detector (ETD). (B) High resolution SE image of a 3D-VAT printout taken using a Through Lens Detector (TLD). (C) Backscattered election (BSE) image taken using a concentric backscatter (CBS) detector. (D): AFM height topography of a carbon dot at the surface of a hydrogel sample. (E) AFM mechanical phase data taken simultaneously with the data in (D). AFM phase data is sensitive to a number of surface properties (hardness, adhesion, etc.) and is often difficult to interpret. In this case, we simply note that the AFM phase contrast observed in (E) allows for easy distinction between areas of the hydrogel (high AFM phase) and the carbon dot surface (low AFM phase). (F): s-SNOM phase data taken simultaneously with the data in (D), with incident illumination at 1490 cm−1. The s-SNOM data was demodulated at the 3rd harmonic of the AFM tapping frequency to reduce the influence of background effects. The hydrogel and the carbon dot particle have different optical responses under the incident illumination, and so s-SNOM phase contrast is observed between the different regions of the AFM scan. Corresponding s-SNOM amplitude data is shown in Fig. S22 of the ESI.† The s-SNOM system used to collect the data shown in this figure consisted of an AFM within one arm of an interferometer, and a moveable mirror in the other. * A conductive platinum-iridium coated NanoWorld ARROW-EFM AFM probe was brought into tapping mode operation upon the sample (tapping frequency 77 kHz, tapping amplitude 71 nm), and illumination from a single-wavelength source outputting at 1490 cm−1 was sent into the interferometer. * — Fig. 12 from “Highly efficient carbon dot-based photoinitiating systems for 3D-VAT printing” by Dominika Krok et al. (2023):
(A) Low magnification secondary electron (SE) image of a 3D-VAT printout taken using an Everhart–Thornley Detector (ETD). (B) High resolution SE image of a 3D-VAT printout taken using a Through Lens Detector (TLD). (C) Backscattered election (BSE) image taken using a concentric backscatter (CBS) detector. (D): AFM height topography of a carbon dot at the surface of a hydrogel sample. (E) AFM mechanical phase data taken simultaneously with the data in (D). AFM phase data is sensitive to a number of surface properties (hardness, adhesion, etc.) and is often difficult to interpret. In this case, we simply note that the AFM phase contrast observed in (E) allows for easy distinction between areas of the hydrogel (high AFM phase) and the carbon dot surface (low AFM phase). (F): s-SNOM phase data taken simultaneously with the data in (D), with incident illumination at 1490 cm−1. The s-SNOM data was demodulated at the 3rd harmonic of the AFM tapping frequency to reduce the influence of background effects. The hydrogel and the carbon dot particle have different optical responses under the incident illumination, and so s-SNOM phase contrast is observed between the different regions of the AFM scan. Corresponding s-SNOM amplitude data is shown in Fig. S22 of the ESI.†

*Dominika Krok, Wiktoria Tomal, Alexander J. Knight, Alexander I. Tartakovskii, Nicholas T. H. Farr, Wiktor Kasprzyk and Joanna Ortyl
Highly efficient carbon dot-based photoinitiating systems for 3D-VAT printing
Polymer Chemistry, 2023, 14, 4429-4444
DOI: https://doi.org/10.1039/D3PY00726J

The article “Highly efficient carbon dot-based photoinitiating systems for 3D-VAT printing” by Dominika Krok, Wiktoria Tomal, Alexander J. Knight, Alexander I. Tartakovskii, Nicholas T. H. Farr, Wiktor Kasprzyk and Joanna Ortyl is licensed under a Creative Commons Attribution 3.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third-party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit https://creativecommons.org/licenses/by/3.0/.

Join us at the Panel Discussion on SPM Cantilevers at SPM Connect today

It’s the second day at #SPMConnect in Washington DC.

There is a Panel Discussion on #SPMCantilevers today at 3:30PM – National Harbor 5.

Our colleagues Manfred Detterbeck (NanoWorld CEO) and Dr. Oliver Krause (NanoWorld R&D team) will be there. Come and join us!

We are looking forward to your questions and an interesting discussion.

NanoWorld AFM probes CEO Manfred Detterbeck in front of a banner at SPM Connect 2024 in Washington DC pointing at the announcement of the panel discussion on SPM cantilevers — Manfred plans to be there. You too?

Dr. Oliver Krause from the NanoWorld AFM probes R&D team beside a banner at SPM Connect 2024 in Washington DC which announces of the panel discussion on SPM cantilevers — Oliver will be there too!

A beginner’s guide to the Characterization of Hydrogel Microarchitecture for Cellular Applications

Hydrogel materials show a number of properties which make them interesting candidates to be utilized to mimic the extracellular matrix (ECM). Therefore, these materials are attractive for use in biological applications such as tissue engineering, cell culture 3D bioprinting and more.

Are you planning to use hydrogels for the first time in your research?

Then have a look at the insightful article “A beginner’s guide to the Characterization of Hydrogel Microarchitecture for Cellular Applications” by Francisco Drusso Martinez-Garcia, Tony Fischer, Alexander Hayn, Claudia Tanja Mierke, Janette Kay Burgess and Martin Conrad Harmsen.

In their article the authors describe and evaluate the different technologies that are most commonly used to assess hydrogel microarchitecture.

Francisco Drusso Martinez-Garcia et al. explain the working principle of the various methods and also discuss the merits and limitations of each of them in view of their usefulness for the characterization of hydrogels.

They introduce and explore the pros and cons of the following methods: Scanning Electron Microscopy (SEM), Cryogenic Scanning Electron Microscopy (Cryo-SEM), Environmental Scanning Electron Microscopy (ESEM), Micro-Computed Tomography (µ-CT), Confocal Laser Scanning Microscopy (CLSM), Second Harmonic Generation and Atomic Force Microscopy (AFM).*

Atomic force microscopy (AFM) can be used to investigate the hydrogel surface topology as well as a hydrogel’s mechanical properties. The latter can be achieved through mathematical modelling of force-distance curves.

When using the AFM to characterize the elasticity of a hydrogel sample it is essential to take the stiffness of the investigated material into account when choosing what kind of AFM probe to use for these experiments.

If an AFM cantilever used for probing a soft sample is too stiff (if the force constant/spring constant is too high) this might result in a poor signal-to-noise ratio.

If a soft AFM probe (an AFM probe with an AFM cantilever with a low force constant) is chosen to investigate a soft material this should lead to a better signal-to-noise ratio. On the other hand, if an AFM cantilever is too soft (if the force constant is too low) then it might not be stiff enough to indent the investigated material.

Another critical factor is the shape and the size of the AFM tip.

Spheroidal AFM probes might stick to the material, resulting in artefacts, disrupted force–distance curves, or even damaged AFM cantilevers. If the AFM tip is much smaller than the pore size of the hydrogel, it might get stuck in the fibrous network microarchitecture.

On the other hand, if the spherical AFM tip, e.g. as in colloidal AFM probes (a sphere glued to end of a tipless AFM cantilever), is too large, the weight of the sphere can have a negative influence on the spring characteristics of the AFM cantilever.

All these factors and more as described in the cited article have to be carefully weighed before deciding on the settings of the atomic force microscope and choosing an AFM probe for the investigation of a specific hydrogel.

NanoWorld tipless ArrowTL2 cantilever arrays with polystyrene beads glued to them were used by the authors of this beginner’s guide to achieve the AFM data presented in the article.*

Figure 6. from Francisco Drusso Martinez-Garcia et al. 2022: Atomic force microscopy. (A) Equipment. (B) Schematic of an AFM setup with a four-quadrant photodiode (1), in which the four-quadrant photodiode (1) receives a laser (2) reflected from a cantilever (3), in this case positioned over a hydrogel (4) mounted in a piezo stage (5). For example, the height differences in a sample (4) are measured by adjusting the stage using piezo elements (5) to counter the cantilever bending on a nanometer scale. (C) The AFM can then generate a surface heightmap of the hydrogels such as a GelMA hydrogel (shown). AFM can also be used to determine the mechanical properties of hydrogels. (D) Schematic of the AFM technique to determine the elastic moduli of hydrogels with a tipless cantilever (1), spheroidal probe (2, red), hydrogel (3), and stiff substrate (4). As the cantilever represents a spring with a known spring constant, the cantilever bending due to elastic counterforces exerted by the soft material is correlated with the piezo stage height (4). (E) The so-called force–distance curves are recorded. Data from a collagen type-I hydrogel (3.0 g/L) are shown. (F) Young’s moduli of a 1.5 g/L and 3.0 g/L collagen type-I hydrogel. Outliers indicated by ◆. AFM equipment detailed in Appendix A of the cited article. NanoWorld tipless ArrowTL2 cantilever arrays with polystyrene beads glued to them were used by the authors of this beginner’s guide to achieve the AFM data presented in the article. — Figure 6. from Francisco Drusso Martinez-Garcia et al. 2022:
Atomic force microscopy. (A) Equipment. (B) Schematic of an AFM setup with a four-quadrant photodiode (1), in which the four-quadrant photodiode (1) receives a laser (2) reflected from a cantilever (3), in this case positioned over a hydrogel (4) mounted in a piezo stage (5). For example, the height differences in a sample (4) are measured by adjusting the stage using piezo elements (5) to counter the cantilever bending on a nanometer scale. (C) The AFM can then generate a surface heightmap of the hydrogels such as a GelMA hydrogel (shown). AFM can also be used to determine the mechanical properties of hydrogels. (D) Schematic of the AFM technique to determine the elastic moduli of hydrogels with a tipless cantilever (1), spheroidal probe (2, red), hydrogel (3), and stiff substrate (4). As the cantilever represents a spring with a known spring constant, the cantilever bending due to elastic counterforces exerted by the soft material is correlated with the piezo stage height (4). (E) The so-called force–distance curves are recorded. Data from a collagen type-I hydrogel (3.0 g/L) are shown. (F) Young’s moduli of a 1.5 g/L and 3.0 g/L collagen type-I hydrogel. Outliers indicated by ◆. AFM equipment detailed in Appendix A of the cited article.

*Francisco Drusso Martinez-Garcia, Tony Fischer, Alexander Hayn, Claudia Tanja Mierke, Janette Kay Burgess and Martin Conrad Harmsen
A Beginner’s Guide to the Characterization of Hydrogel Microarchitecture for Cellular Applications
Gels 2022, 8(9), 535
DOI: https://doi.org/10.3390/gels8090535

The article “A Beginner’s Guide to the Characterization of Hydrogel Microarchitecture for Cellular Applications” by Francisco Drusso Martinez-Garcia, Tony Fischer, Alexander Hayn, Claudia Tanja Mierke, Janette Kay Burgess and Martin Conrad Harmsen is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third-party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit https://creativecommons.org/licenses/by/4.0/.