Month: July 2019

Ultra-high resolution imaging of thin films and single strands of polythiophene using atomic force microscopy

Real-space images of polymers with sub-molecular resolution could provide valuable insights into the relationship between morphology and functionality of polymer optoelectronic devices, but their acquisition is problematic due to perceived limitations in atomic force microscopy (AFM).*

In the article “Ultra-high resolution imaging of thin films and single strands of polythiophene using atomic force microscopy” Vladimir V. Korolkov, Alex Summerfield, Alanna Murphy, David B. Amabilino, Kenji Watanabe, Takashi Taniguchi and Peter H. Beton show that individual thiophene units and the lattice of semicrystalline spin-coated films of polythiophenes (PTs) may be resolved using AFM under ambient conditions through the low-amplitude (≤ 1 nm) excitation of higher eigenmodes of a cantilever.*

They authors demonstrate that the use of higher eigenmodes in tapping-mode ambient AFM can be successfully employed to characterize both individual polymer strands down to a single-atom level and also the ordering of a semi-crystalline polymer with technological relevance. The combination of AFM and solution deposition provides a simple and high-resolution approach to characterizing the structure of polymers.*

The use of NanoWorld Arrow-UHF high frequency AFM probes at their first eigenmode of ~1.4 MHz is mentioned.*


Figure 1a from “Ultra-high resolution imaging of thin films and single strands of polythiophene using atomic force microscopy” by V. Korolkov et al.: High-resolution AFM images of P3DT adsorbed on the surface of hBN. a An overview height scan of P3DT assembled on hBN, scan rate 6.51 Hz, 1024 × 1024 px; inset shows lattice frequency shift image of hBN acquired in FM-AFM tapping mode, scan rate 39 Hz, 512 × 512 px; both images were acquired with the same Arrow UHF probe oscillating at fundamental frequency of 1.42 MHz.

*Vladimir V. Korolkov, Alex Summerfield, Alanna Murphy, David B. Amabilino, Kenji Watanabe, Takashi Taniguchi and Peter H. Beton
Ultra-high resolution imaging of thin films and single strands of polythiophene using atomic force microscopy
Nature Communications, volume 10, Article number: 1537 (2019)
doi: https://doi.org/10.1038/s41467-019-09571-6

Please follow this external link to read the full article: https://rdcu.be/bLSdL

Open Access: The article « Ultra-high resolution imaging of thin films and single strands of polythiophene using atomic force microscopy » by Vladimir V. Korolkov, Alex Summerfield, Alanna Murphy, David B. Amabilino, Kenji Watanabe, Takashi Taniguchi and Peter H. Beton is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

AFM probes for Magnetic Force Microscopy – screencast on NanoWorld MFM tips passes 1500 views mark

The screencast about NanoWorld AFM probes for Magnetic Force Microscopy held by Dr. Marco Becker has just passed the 1500 views mark. Congratulations Marco!

Magnetic Force Microcopy is a type of Atomic Force Microscopy in which a magnetised AFM tip is used to measure magnetic interactions between the tip and the surface of a magnetic sample. These detected interactions are then used to reconstruct the magnetic structure of the sample surface

NanoWorld currently offers two types of MFM tips:

– MFMR – This type of magnetic AFM tip is coated with a hard magnetic coating on the tip side and yields a very high force sensitivity, while simultaneously enabling tapping and lift mode operation.

– S-MFMR – These magnetic AFM tips are coated with a soft magnetic layer on the tip side and are designed for the measurement of magnetic domains in soft magnetic samples.

Direct Observation of Long-Chain Branches in a Low-Density Polyethylene

The properties of a polymer change significantly depending on the structure of the polymer chain, particularly, with branched structures, depending on the number of branches and the length of the branch.* However, the long-chain branch (LCB) structure of polyethylene was unclear, due particularly to the complex polymer structure and the limitations of its analysis methods.

In their study “Direct Observation of Long-Chain Branches in a Low-Density Polyethylene” Ken-ichi Shinohara, Masahiro Yanagisawa and Yuu Makida measured the chain length of LCBs and the distance between branch points of LDPE by atomic force microscopy.*

The article mentions the use of NanoWorld Ultra-Short Cantilevers (USC) for high speed atomic force microscopy ( AFM probe type USC-F1.2-k0.15 ) for the single-molecule imaging by atomic force microscopy .*

Figure 1 from “Direct Observation of Long-Chain Branches in a Low-Density Polyethylene “ by K. Shinohara et al.: Direct measurement of LCB in a tubular LDPE (F200-0 fractionated). (A) AFM image of a single molecule of LDPE on mica in DMTS at 25 °C. X: 279 nm, Y: 209 nm, Z: 18 nm. (B) Length of each chain of LDPE. (C) A wire model of self-shrinking structure of polymer chain of LDPE. Main chain: red wire. LCB: black wire. The model was created to be one tenth of the length of the extended chain based on AFM observation (B), MD simulation (Fig. S1), and the molecular weight determined by SEC-MALLS-Visc experiments (see Fig. 2).
Figure 1 from “Direct Observation of Long-Chain Branches in a Low-Density Polyethylene “ by K. Shinohara et al.: Direct measurement of LCB in a tubular LDPE (F200-0 fractionated). (A) AFM image of a single molecule of LDPE on mica in DMTS at 25 °C. X: 279 nm, Y: 209 nm, Z: 18 nm. (B) Length of each chain of LDPE. (C) A wire model of self-shrinking structure of polymer chain of LDPE. Main chain: red wire. LCB: black wire. The model was created to be one tenth of the length of the extended chain based on AFM observation (B), MD simulation (Fig. S1), and the molecular weight determined by SEC-MALLS-Visc experiments (see Fig. 2).

*Ken-ichi Shinohara, Masahiro Yanagisawa, Yuu Makida
Direct Observation of Long-Chain Branches in a Low-Density Polyethylene
Nature Scientific Reportsvolume 9, Article number: 9791 (2019)
doi: https://doi.org/10.1038/s41598-019-46035-9

Please follow this external link for the full article: https://rdcu.be/bJY7S

Open Access: The article «Direct Observation of Long-Chain Branches in a Low-Density Polyethylene» by Ken-ichi Shinohara, Masahiro Yanagisawa and Yuu Makida is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.