We are currently meeting customers at the nano tech 2019, the international nanotechnology exhibition and conference at Tokyo Big Sight, January 30 – February 1, 2019.
See you at booth 4T-13 of Toyo Corporation, our distributor in Japan!
We are currently meeting customers at the nano tech 2019, the international nanotechnology exhibition and conference at Tokyo Big Sight, January 30 – February 1, 2019.
See you at booth 4T-13 of Toyo Corporation, our distributor in Japan!
In the article «Self-assembled PCBM bilayers on graphene and HOPG examined by AFM and STM” Yanlong Li, Chuanhui Chen, John Burton, Kyungwha Park, James R Heflin and Chenggang Tao demonstrate that PCBM molecules self-assemble into bilayer structures on graphene and HOPG substrates. They used Atomic Force Microscopy (AFM) and Scanning Tunneling Microscopy (STM), and analyzed the observed morphology by comparison to molecular models.*
The AFM measurements were carried out in a dark environment. NanoWorld™ Pointprobe® NCST AFM probes were used in soft tapping mode and simultaneous height and phase images were acquired and reproduced across multiple samples.*
The results of this study shed light on improvement of the energy efficiency in solar cells containing graphene and organic molecules, by increasing the donor–acceptor interface area and could provide valuable insight into fabrication of new hybrid, ordered structures for applications to organic solar cells.*
*Yanlong Li, Chuanhui Chen, John Burton, Kyungwha Park, James R Heflin, Chenggang Tao
Self-assembled PCBM bilayers on graphene and HOPG examined by AFM and STM
Nanotechnology, Volume 29, Number 18 (2018)
DOI: https://doi.org/10.1088/1361-6528/aab00a
Open Access The article “Self-assembled PCBM bilayers on graphene and HOPG examined by AFM and STM” by Yanlong Li et al. is licensed under a Creative Commons Attribution 3.0 International License. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI. To view a copy of this license, visit https://creativecommons.org/licenses/by/3.0/
Read how Nanoworld Arrow-EFM AFM probes were used in the paper “Ferroelectric domains and phase transition of sol-gel processed epitaxial Sm-doped BiFeO3 (001) thin films” in which the authors Zhen Zhou, Wie Sun, Zhenyu Liao, Shuai Ning, Jing Zhu and Jing-Feng Li:
Their work revealed the origin of the high piezoresponse of Sm-doped BiFeO3 thin films at the morphotropic phase boundary (MPB).*
A PtIr-coated NanoWorld Arrow-EFM cantilever with a nominal spring constant of 2.8 N/m and a typical resonant frequency of 75 kHz was used in all imaging modes mentioned in the article.
*Zhen Zhou, Wie Sun, Zhenyu Liao, Shuai Ning, Jing Zhu, Jing-Feng Li
Ferroelectric domains and phase transition of sol-gel processed epitaxial Sm-doped BiFeO3 (001) thin films
Journal of Materiomics, Volume 4, Issue 1, March 2018, Pages 27-34
DOI: https://doi.org/10.1016/j.jmat.2017.11.002
Please follow this external link if you would like to read the full article: https://www.sciencedirect.com/science/article/pii/S2352847817300631
Open Access The article “Ferroelectric domains and phase transition of sol-gel processed epitaxial Sm-doped BiFeO3 (001) thin films” by Zhen Zhou, Wie Sun, Zhenyu Liao, Shuai Ning, Jing Zhu and Jing-Feng Li is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.