Researchers from the Physics Department at Durham University demonstrate an imaging technique using Atomic Force Microscopy in their JoVE Engineering publication.
For each step, the authors have explained the scientific rationale behind their choices to facilitate the adaptation of the methodology to every user’s specific system.
The NanoWorld Arrow-UHF AFM probe for high speed AFM is also mentioned in this publication.
Ethan J. Miller, William Trewby, Amir Farokh Payam, Luca Piantanida, Clodomiro Cafolla, Kislon Voïtchovsky, Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid (2016), JoVE, 1940-087X, doi:10.3791/54924
https://www.jove.com/video/54924/sub-nanometer-resolution-imaging-with-amplitude-modulation-atomic
Creative Commons Attribution
https://doi.org/10.3791/54924
Copyright © 2016 Creative Commons Attribution 3.0 License
