NanoWorld™ Pyrex-Nitride AFM probes are designed
for various imaging applications in contact or dynamic mode.
They fit to all well-known commercial SPMs (Scanning Probe Microscopes)
and AFMs (Atomic Force Microscopes).

The probes consist of silicon nitride cantilevers and tips
supported by a holder chip made of glass.
Currently three different versions of Pyrex-Nitride Probes are available:
Probes with rectangular cantilevers, probes with triangular cantilevers and probes with
triangular cantilevers without tips.

Quick Selection Table

Complete NanoWorld Product Flyer is available for download here.