NanoWorld Pointprobe® S-MFMR AFM probes are designed for the measurement of magnetic domains in soft magnetic samples. Due to the low coercivity of the soft magnetic tip coating the magnetisation of the tip will easily get reoriented by hard magnetic samples.

All probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. The tip is shaped like a polygon based pyramid with a height of 10-15 µm.

Additionally this sensor offers unique features:

· soft magnetic coating on the tip side (coercivity of app. 0.75 Oe, remanence magnetization of app. 225 emu/cm3)
· effective magnetic moment 0.75x of standard probes
· tip radius of curvature of the coated tip < 30 nm
· magnetic resolution better than 35 nm

The S-MFMR is coated with a soft magnetic thin film. This soft magnetic coating on the tip has a coercivity of app. 0.75 Oe and a remanence magnetization of app. 225 emu/cm3 (these values were determined on a flat surface). For enhanced signal strength the magnetization of the tip by means of a strong permanent magnet prior to the measurement is recommended.

Reflex coating is an approximately 30 nm thick aluminium coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the cantilever. As the coating is almost stress free the bending of the cantilever due to stress is less than 2°.