 |
 Type: NCST |
| Non-contact / Soft Tapping mode |
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NanoWorld Pointprobe® NCST AFM probes are designed for non-contact or soft tapping™ mode imaging. The combination of soft cantilever and fairly high resonance frequency enables stable and fast measurements with reduced tip-sample interaction. Thus, tip and sample wear could be significantly decreased. All probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a height of 10-15 µm.Additionally this AFM probe offers a typical tip radius of curvature of less than 8 nm. |
| Technical Data | Value | Range* |  |
| Thickness | 2.8 µm | 2.3 – 3.3 | |
| Mean Width | 27 µm | 22 - 32 | |
| Length | 150 µm | 145 - 155 | |
| Force Constant | 7.4 N/m | 3 – 16 | |
| Resonance Frequency | 160 kHz | 120 - 205 | |
| Order Code | Quantity | Data Sheet | |
| NCST-10 | 10 | yes | |
| NCST-20 | 20 | yes | |
| NCST-50 | 50 | no | |
| NCST-W | 380 | yes | |
* Typical values |
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| For applications requiring lower resonance frequencies or a cantilever length exceeding 150 µm we recommend our Pointprobe® type NCL. For standard non-contact / tapping™ mode application we recommend our Pointprobe® type NCH. For more information contact: info@nanoworld.com | |
| POINTPROBE® is a registered trademark of NANOWORLD AG All data are subject to change without notice. |
NanoWorld AG Rue Jaquet-Droz 1 Case Postale 216 CH-2002 Neuchâtel Switzerland www.nanoworld.com |