Type: CONTSCR
Contact Mode – Short Cantilever - Reflex coating

NanoWorld Pointprobe® CONTSCR AFM probe is an alternative cantilever type for contact mode applications. The length of cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode probes for some AFM instruments. Additionally, this probe type allows the application for lateral or friction force mode.

All SPM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a height of 10 -15 µm.
Additionally this probe offers typical tip radius of curvature of less than 8 nm.
The reflex coating on the detector side of the cantilever enhances its reflectivity and prevents light from interfering within the cantilever.


Technical Data Value Range*
Thickness 1 µm 0.5 - 1.5
Mean Width 48 µm 42.5 - 52.5
Length 225 µm 220 - 230
Force Constant 0.2 N/m 0.02 - 0.7
Resonance Frequency 23 kHz 10 - 39

 

 
Order Code Quantity Data Sheet
CONTSCR-10 10 yes
CONTSCR-20 20 yes
CONTSCR-50 50 no
CONTSCR-W 380 yes

* Typical values

Reflex Coating
Reflex coating is an approximately 30 nm thick aluminium coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the cantilever. As the coating is almost stress free the bending of the cantilever due to stress is less than 2°.

For more information contact: info@nanoworld.com

POINTPROBE® is a registered trademark of NANOWORLD AG
GelPak® is a registered trademark of Vichem Corporation
All data are subject to change without notice. 		NanoWorld AG
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