NanoWorld AFM Probes Brochure  english |deutsch |français |español |português |рyccĸий |日本語 |한국어 |简体中文 |繁體中文
INNOVATION AND PRECISION - TWO KEY ELEMENTS FOR SUCCESS

Nanotechnology is our field. Precision is our tradition.

Innovation is our key instrument.

Thats why we are located in Switzerland, one of the most powerful
and innovative areas in Europe.

Using our knowledge as well as our high precision AFM Probes, our clients are
able to get the best results they need for atomic force microscopy (AFM).

AFM probe
highlighted today:
Pointprobe® EFM Pointprobe® EFM
[fo: 75 kHz, C: 2.8 N/m]
• made from monolithic silicon
• designed for Electrostatic
Force Microscopy
• typical tip radius of less
than 25 nm
• platinum iridium coating
allows electrical contacts
between tip and sample
NanoWorld AFM Probes
+ + + + + + + + + + + + + + + + + + + + + + + + + + +
AFM Probes Catalogue
Member of NanoWorld Group