Arrow silicon SPM-Probes optimized positioning  through maximized tip visibility
Our new Arrow™ probe is designed for easy tip positioning
and high resolution imaging. It fits to all well-known commercial
SPMs (Scanning Probe Microscopes). The AFM probe consists of a
holding chip with a cantilever which has a tetrahedral tip at its
triangular free end.
The probe is entirely made of monolithic, highly doped silicon.

In our
  Quick Selection Table

you can easily find the right AFM tip for your application.

You can find further information on one of the following pages:
  • General Description Arrow Silicon-SPM-Probes
  • Available Coatings
  •   Complete NanoWorld Product Brochure is available for download here.
    NanoWorld AFM Probes
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